Control of Switching Modes and Conductance Quantization in Oxygen Engineered HfOx based Memristive Devices

SU Sharath, S Vogel, L Molina‐Luna… - Advanced Functional …, 2017 - Wiley Online Library
Hafnium oxide (HfOx)‐based memristive devices have tremendous potential as nonvolatile
resistive random access memory (RRAM) and in neuromorphic electronics. Despite its …

Bipolar, complementary resistive switching and synaptic properties of sputtering deposited ZnSnO-based devices for electronic synapses

M Ismail, C Mahata, H Abbas, C Choi, S Kim - Journal of Alloys and …, 2021 - Elsevier
In this work, ZnSnO-based resistive switching (RS) devices were fabricated with different top
electrodes (TEs) to investigate the RS and synaptic characteristics for neuromorphic …

Design of CMOS Compatible, High‐Speed, Highly‐Stable Complementary Switching with Multilevel Operation in 3D Vertically Stacked Novel HfO2/Al2O3/TiOx …

W Banerjee, X Zhang, Q Luo, H Lv, Q Liu… - Advanced Electronic …, 2018 - Wiley Online Library
Complementary resistive switching (CRS) is a suitable approach to minimize the sneak
leakage paths through a large resistive random access memory (RRAM) array. Here, an …

Complementary resistive switching behaviors evolved from bipolar TiN/HfO2/Pt device

X Chen, W Hu, Y Li, S Wu, D Bao - Applied Physics Letters, 2016 - pubs.aip.org
In this letter, the dynamic evolution of TiN/HfO 2/Pt device from bipolar resistive switching
(BRS) to complementary resistive switching (CRS) was reported. The device exhibits the …

Enhancement of resistive switching performance by introducing a thin non-stoichiometric CeO2-x switching layer in TiO2-based resistive random access memory

M Ismail, SU Nisa, AM Rana, T Akbar, J Lee… - Applied Physics …, 2019 - pubs.aip.org
By introducing a thin non-stoichiometric CeO 2-x switching layer between the high oxygen
affinity metal TaN top electrode and the TiO 2 layer in a TaN/CeO 2-x/TiO 2/Pt bilayer (BL) …

Intrinsic anionic rearrangement by extrinsic control: Transition of RS and CRS in thermally elevated TiN/HfO 2/Pt RRAM

W Banerjee, WF Cai, X Zhao, Q Liu, H Lv, S Long… - Nanoscale, 2017 - pubs.rsc.org
The sneak path problem is one of the major hindrances to the application of high-density
crossbar resistive random access memory; however, complementary resistive switching …

Influence of nano-clay platelet concentration on achieving a transition from write once read many (WORM) to complementary resistive switching (CRS) behaviour in …

SK Bhattacharjee, C Debnath, SA Hussain… - Journal of Materials …, 2024 - Springer
Resistive memory devices are a promising technology, but they face challenges like sneak
paths in crossbar arrays. Complementary resistive switching (CRS) devices offer a …

Comparison of diverse resistive switching characteristics and demonstration of transitions among them in Al-incorporated HfO 2-based resistive switching memory for …

SA Khan, S Kim - RSC advances, 2020 - pubs.rsc.org
Diverse resistive switching behaviors are observed in the Pt/HfAlOx/TiN memory device
depending on the compliance current, the sweep voltage amplitude, and the bias polarity …

Bulk Oxygen–Ion Storage in Indium–Tin–Oxide Electrode for Improved Performance of HfO2-Based Resistive Random Access Memory

PH Chen, KC Chang, TC Chang… - IEEE Electron …, 2016 - ieeexplore.ieee.org
Indium-tin-oxide (ITO) is investigated as the top electrode material in HfO 2-based resistive
random access memory cells. Experimental results show that in contrast to a metal (Pt) …

Transition between resistive switching modes in asymmetric HfO2-based structures

OO Permiakova, AE Rogozhin, AV Miakonkikh… - Microelectronic …, 2023 - Elsevier
We claim that the evolution of conductive filaments (CF) in bipolar resistive switching (BRS)
and complementary resistive switching (CRS) is similar in HfO 2-based structures with one …