Progress in ultraviolet photodetectors based on II–VI group compound semiconductors

J Wang, Y Xing, F Wan, C Fu, CH Xu… - Journal of materials …, 2022 - pubs.rsc.org
Ultraviolet (UV) photodetectors (PDs) have found widespread application in various fields,
such as environmental protection, life sciences, secure communications, automated …

Wafer-scale synthesis of a uniform film of few-layer MoS2 on GaN for 2D heterojunction ultraviolet photodetector

N Goel, R Kumar, B Roul, M Kumar… - Journal of Physics D …, 2018 - iopscience.iop.org
Layered transition metal dichalcogenide materials grown over a conventional 3D
semiconductor substrate have ignited a spark of interest in the electronics industry. The …

Toward a Fast and Highly Responsive SnSe2-Based Photodiode by Exploiting the Mobility of the Counter Semiconductor

EP Mukhokosi, B Roul, SB Krupanidhi… - ACS applied materials …, 2019 - ACS Publications
In photodetection, the response time is mainly controlled by the device architecture and
electron/hole mobility, while the absorption coefficient and the effective separation of the …

Temperature dependence of current-and capacitance–voltage characteristics of an Au/4H-SiC Schottky diode

M Gülnahar - Superlattices and Microstructures, 2014 - Elsevier
In this study, the current–voltage (I–V) and capacitance–voltage (C–V) measurements of an
Au/4H-SiC Schottky diode are characterized as a function of the temperature in 50–300 K …

Defect-free ZnO nanorods for low temperature hydrogen sensor applications

S Ranwa, PK Kulriya, VK Sahu, LM Kukreja… - Applied Physics …, 2014 - pubs.aip.org
Uniformly distributed and defect-free vertically aligned ZnO nanorods (NRs) with high aspect
ratio are deposited on Si by sputtering technique. X-ray diffraction along with transmission …

Space charge limited current in 4H-SiC Schottky diodes in the presence of stacking faults

M Vivona, P Fiorenza, V Scuderi, F La Via… - Applied Physics …, 2023 - pubs.aip.org
The presence of crystallographic defects can induce notable effects on the mechanisms
ruling the current transport in metal/semiconductor contacts. In this context, in this Letter, the …

Determination of band alignment at two-dimensional MoS2/Si van der Waals heterojunction

N Goel, R Kumar, M Mishra, G Gupta… - Journal of Applied …, 2018 - pubs.aip.org
To understand the different mechanism occurring at the MoS 2-silicon interface, we have
fabricated a MoS 2/Si heterojunction by exfoliating MoS 2 on top of the silicon substrate …

Enhanced Carrier Density in a MoS2/Si Heterojunction-Based Photodetector by Inverse Auger Process

N Goel, R Kumar, M Hojamberdiev… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
When exploring the charge transport in the MoS 2/Si heterojunction, it is imperative to
understand the contribution of different carrier interactions and scattering mechanisms in the …

Tuning of Schottky barrier height of Al/n-Si by electron beam irradiation

IP Vali, PK Shetty, MG Mahesha, VC Petwal… - Applied Surface …, 2017 - Elsevier
The effect of electron beam irradiation (EBI) on Al/n-Si Schottky diode has been studied by I–
V characterization at room temperature. The behavior of the metal-semiconductor (MS) …

[HTML][HTML] Space charge limited corrections to the power figure of merit for diamond

H Surdi, T Thornton, RJ Nemanich… - Applied Physics …, 2022 - pubs.aip.org
An interpretation of the unipolar figure of merit is formulated for wide bandgap (WBG)
semiconductors based on the on-state specific resistance (⁠ R ON, sp⁠) derived from the …