Solar cell metallization using inline electroless plating
Int. Cl. Inline methods for forming a photovoltaic cell electrode B05D 5/2(2006.01) structure,
wherein the photovoltaic cell includes a semicon C2. 5D 5/34(2006.01) ductor Substrate …
wherein the photovoltaic cell includes a semicon C2. 5D 5/34(2006.01) ductor Substrate …
Method and apparatus of using peak force tapping mode to measure physical properties of a sample
J Shi, Y Hu, S Hu, J Ma, C Su - US Patent 8,650,660, 2014 - Google Patents
US8650660B2 - Method and apparatus of using peak force tapping mode to measure
physical properties of a sample - Google Patents US8650660B2 - Method and apparatus of …
physical properties of a sample - Google Patents US8650660B2 - Method and apparatus of …
Infrared characterization of a sample using oscillating mode
An apparatus and method of performing sample characterization with an AFM and a pulsed
IR laser directed at the tip of a probe of the AFM. The laser pulses are synchronized with the …
IR laser directed at the tip of a probe of the AFM. The laser pulses are synchronized with the …
Micromachined scanning thermal probe method and apparatus
YB Gianchandani, MH Li, J Wu - US Patent 6,692,145, 2004 - Google Patents
3.683, 671 A* 8/1972 Van Swaay.................. 374/44 different thermal conductivities at
different positions. A 3,688,581. A* 9/1972 Le Quernec..... 374/173 second flexible probe …
different positions. A 3,688,581. A* 9/1972 Le Quernec..... 374/173 second flexible probe …
Scanning probe system with spring probe and actuation/sensing structure
T Hantschel, EM Chow, DK Fork, MA Rosa… - US Patent …, 2004 - Google Patents
Scanning probe microscopy (SPM; also known as atomic force microscopy (AFM) is
considered a spin-off of Scan ning tunneling microscopy (STM). An SPM system mea Sures …
considered a spin-off of Scan ning tunneling microscopy (STM). An SPM system mea Sures …
Scanning probe system with spring probe
T Hantschel, EM Chow, DK Fork - US Patent 6,668,628, 2003 - Google Patents
Appl. No.: 10/112,215(57) 1-1. Scanning probe Systems, which include Scanning probe (22)
Filed: Mar. 29, 2002 microscopes (SPMs), atomic force microscope (AFMs), or (65) Prior …
Filed: Mar. 29, 2002 microscopes (SPMs), atomic force microscope (AFMs), or (65) Prior …
Scanning probe system with spring probe
T Hantschel, EM Chow, DK Fork - US Patent 6,788,086, 2004 - Google Patents
Scanning probe Systems, which include Scanning probe microscopes (SPMs), atomic force
microscope (AFMs), or profilometers, are disclosed that use cantilevered Spring (eg, stressy …
microscope (AFMs), or profilometers, are disclosed that use cantilevered Spring (eg, stressy …
Peakforce photothermal-based detection of IR nanoabsorption
GO Andreev - US Patent 8,955,161, 2015 - Google Patents
(51) Int. Cl. Anapp d method of performing phototh lchemi G0IO 60/24(2010.01) cal
nanoidentification of a sample includes positioning a tip G0IO 60/04(201 0.015 of a probe at …
nanoidentification of a sample includes positioning a tip G0IO 60/04(201 0.015 of a probe at …
Method and apparatus of using peak force tapping mode to measure physical properties of a sample
C Su, J Shi, Y Hu, S Hu, J Ma - US Patent 9,291,640, 2016 - Google Patents
US9291640B2 - Method and apparatus of using peak force tapping mode to measure
physical properties of a sample - Google Patents US9291640B2 - Method and apparatus of …
physical properties of a sample - Google Patents US9291640B2 - Method and apparatus of …
Sputtered spring films with low stress anisotropy
Methods are disclosed for fabricating Spring Structures that minimize helical twisting by
reducing or eliminating StreSS anisotropy in the thin films from which the Springs are formed …
reducing or eliminating StreSS anisotropy in the thin films from which the Springs are formed …