Tomographic diffractive microscopy and multiview profilometry with flexible aberration correction

H Liu, J Bailleul, B Simon, M Debailleul, B Colicchio… - Applied …, 2014 - opg.optica.org
We have developed a tomographic diffractive microscope in reflection, which permits
observation of sample surfaces with an improved lateral resolution, compared to a …

Nanometric resolution with far-field optical profilometry

S Arhab, G Soriano, Y Ruan, G Maire, A Talneau… - Physical review …, 2013 - APS
We show experimentally that a resolution far beyond that of conventional far-field optical
profilometers can be reached with optical diffraction tomography. This result is obtained in …

Measurement of roughness based on the Talbot effect in reflection from rough surfaces

M Dashtdar, A Mohammadzade… - Applied Optics, 2015 - opg.optica.org
In the present work, the Talbot effect of a square grating is analyzed when light is reflected
from a rough surface. It is shown theoretically that the scattered light intensity in the Fresnel …

Full polarization optical profilometry

S Arhab, H Giovannini, K Belkebir, G Soriano - JOSA A, 2012 - opg.optica.org
Optical digital tomographic microscopy can be used for profilometry. The profile of the
surface can be estimated from measurements of the complex diffracted far field obtained …

Nonparametric reconstruction of the statistical properties of penetrable, isotropic randomly rough surfaces from in-plane, co-polarized light scattering data: Application …

VP Simonsen, D Bedeaux, I Simonsen - Physical Review A, 2021 - APS
An approach is introduced for the nonparametric reconstruction of the statistical properties of
penetrable, isotropic randomly rough surfaces from in-plane, co-polarized light scattering …

Newton-kantorovich method applied to the reconstruction of surface profiles under Tikhonov's regularization with domain constraint

S Arhab, M Joelson, G Micolau - 2017 Progress In …, 2017 - ieeexplore.ieee.org
In this work we propose an efficient algorithm for reconstructing a one dimensional perfectly
conducting rough surface. The data are the complex amplitude of the diffracted far field in …

Design of an optical linear discriminant filter for classification of subwavelength concave and convex defects on dielectric substrates

J Sugisaka, T Yasui, K Hirayama - JOSA A, 2022 - opg.optica.org
Identification of the defect type on substrate materials is essential for enhancing their yield
ratio. We propose a novel optical filter to discriminate between subwavelength-order …

High-order functional derivatives of the scattered field according to the permittivity-contrast function

S Arhab, D Anagnostou, M Joelson - Wave Motion, 2018 - Elsevier
In this work, we propose to extend an approach to calculate at any order (n), the functional
derivative of the scattered field with respect to the permittivity-contrast function of a three …

Inverse wave scattering of rough surfaces with emitters and receivers in the transition zone

S Arhab, G Soriano - Progress In Electromagnetics Research M, 2016 - jpier.org
We deal with the problem of determining the profile of a perfectly conducting rough surface
from single-frequency and multistatic data. The two fundamental polarizations are …

[PDF][PDF] Principe de réciprocité appliqué au calcul de la dérivée de Fréchet de l'opérateur non linéaire de propagation d'ondes dans les milieux élastiques et …

S Arhab, G Lefeuve-Mesgouez… - … Congrès Français de …, 2017 - cfm2017.sciencesconf.org
Les équations de l'élastodynamique expriment une non linéarité entre les paramètres
mécaniques et le champ des déplacements. Cette non linéarité fait partie des difficultés …