Over the last 10 or so years, developments in molecular se-condary ion mass spectrometry
(SIMS) have taken its capability into areas previously only demonstrated in dynamic SIMS …

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is used for chemical analysis of
surfaces. ToF‐SIMS is a powerful tool for polymer science because it detects a broad mass …

Well defined reference materials consisting of Irganox 1010 and either Irganox 1098 or
Fmoc-pentafluoro-l-phenylalanine (Fmoc-PFLPA) are described. These have been analysed …

Secondary ion mass spectrometry (SIMS) has become a powerful technique for the label-
free analysis of organics from cells to electronic devices. The development of cluster ion …

We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards)
interlaboratory study on the measurement of composition in organic depth profiling. Layered …

Quantitative analysis of binary mixtures of tris (2-phenylpyridinato) iridium (III)(Ir (ppy) 3) and
tris (8-hydroxyquinolinato) aluminum (Alq3) by using an artificial neural network (ANN) …

Rationale Matrix effects cause a nonlinear relationship between ion intensities and
concentrations in mass spectrometry, including time‐of‐flight secondary ion mass …

Matrix effects in the secondary ion mass spectrometry (SIMS) of selected elemental systems
have been analyzed to investigate the applicability of a mathematical description of the …

We demonstrate two methods to improve the quality of organic depth profiling by C60
sputtering using multilayered reference samples as part of a VAMAS (Versailles project on …

Quantification of the composition of binary mixtures in secondary ion mass spectrometry
(SIMS) is required in the analyses of technological materials from organic electronics to drug …