Laser projection system using variable part alignment
KD Rueb - US Patent 9,245,062, 2016 - Google Patents
BACKGROUND Improvements in the dimensional accuracy of a manufac turing process are
an objective of every manufacturing facil ity. Statistical quality control has made use of …
an objective of every manufacturing facil ity. Statistical quality control has made use of …
Inspection system and method for defect analysis of wire connections
RF Wieser - US Patent 10,186,025, 2019 - Google Patents
The invention relates to an inspection system (10) for defect analysis of a wire connection
(11) between a substrate (13) and a semiconductor component (15, 16) of a product (12) …
(11) between a substrate (13) and a semiconductor component (15, 16) of a product (12) …
Machine vision inspection system and method
J Mahon, J Wall, J Tracey, M Dullaghan… - US Patent App. 10 …, 2004 - Google Patents
A machine vision system has an illumination head (1) with seven rings of LEDs 2-8, each
having a different elevational angle. Each ring is configured with a particular current level …
having a different elevational angle. Each ring is configured with a particular current level …
Apparatus and method for measuring a three dimensional shape
SJ Lee, K Koh, MY Jeon, YUN Sang-Kyu… - US Patent …, 2019 - Google Patents
Provided are an apparatus and a method for measuring a three dimensional shape with
improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of …
improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of …
Apparatus and method for measuring a three dimensional shape
SJ Lee, K Koh, MY Jeon, YUN Sang-Kyu… - US Patent …, 2020 - Google Patents
Provided are an apparatus and a method for measuring a three dimensional shape with
improved accuracy. The appa ratus includes a stage, at least one lighting unit, a plurality of …
improved accuracy. The appa ratus includes a stage, at least one lighting unit, a plurality of …
Projection apparatus, measurement apparatus, system, and method of manufacturing product
H Kitamura - US Patent App. 15/663,114, 2018 - Google Patents
The present invention provides a projection apparatus that projects line-light onto an object
by a projection optical system, the apparatus comprising a generation unit configured to …
by a projection optical system, the apparatus comprising a generation unit configured to …
Apparatus and method for measuring a three dimensional shape
SJ Lee, K Koh, MY Jeon, YUN Sang-Kyu… - US Patent …, 2021 - Google Patents
Provided are an apparatus and a method for measuring a three dimensional shape with
improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of …
improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of …