Beryllium-based multilayer X-ray optics

VN Polkovnikov, NN Salashchenko… - Physics …, 2020 - iopscience.iop.org
The article provides a review of the current state of affairs in the field of physics and
technology of multilayer beryllium-containing mirrors intended for projection lithography and …

Diffraction limited X-ray optics: technology, metrology, applications

NI Chkhalo, IV Malyshev, AE Pestov… - Physics …, 2020 - iopscience.iop.org
Progress in the fabrication technology of normal incidence multilayer interference mirrors
permits the traditional optical methods of microscopy, astronomy, and lithography to be …

Multifitting: software for the reflectometric reconstruction of multilayer nanofilms

M Svechnikov - Journal of Applied Crystallography, 2020 - journals.iucr.org
Multifitting is a computer program designed specifically for modeling the optical properties
(reflection, transmission, absorption) of multilayer films consisting of an arbitrary number of …

[PDF][PDF] Efficient high-order suppression system for a metrology beamline

A Sokolov, MG Sertsu, A Gaupp… - Journal of …, 2018 - journals.iucr.org
High-quality metrology with synchrotron radiation requires in particular a very high spectral
purity of the incident beam. This is usually achieved by a set of transmission filters with …

Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV

M Svechnikov, N Chkhalo, A Lopatin… - Journal of …, 2020 - journals.iucr.org
In this work, the refractive index of beryllium in the photon energy range 20.4–250 eV was
experimentally determined. The initial data include measurements of the transmittance of …

Multilayer X-ray interference structures

VV Lider - Physics-Uspekhi, 2019 - iopscience.iop.org
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