Blind quality assessment of iris images acquired in visible light for biometric recognition

M Jenadeleh, M Pedersen, D Saupe - Sensors, 2020 - mdpi.com
Image quality is a key issue affecting the performance of biometric systems. Ensuring the
quality of iris images acquired in unconstrained imaging conditions in visible light poses …

Noise-tolerant texture feature extraction through directional thresholded local binary pattern

SM Tabatabaei, A Chalechale - The Visual Computer, 2020 - Springer
Local binary pattern (LBP) is a multi-applicable texture descriptor applied in machine vision.
Despite its outstanding abilities in revealing textural properties of image, it is sensitive to …

Blind Image and Video Quality Assessment

M Jenadeleh - 2018 - kops.uni-konstanz.de
The popularity and affordability of handheld imaging devices, especially smartphones, along
with the rapid development of social media such as Facebook, Flickr, and YouTube have …

Median arc center corrected binary pattern (MACCBP) for noise robust feature extraction

SM Tabatabaei, A Chalechale - Multidimensional Systems and Signal …, 2022 - Springer
Local binary pattern (LBP) is an efficient texture descriptor with increasing applications in
machine vision. Notwithstanding the great ability of LBP in revealing texture features of …

Realtime quality assessment of iris biometrics under visible light

M Jenadeleh, M Pedersen… - Proceedings of the IEEE …, 2018 - openaccess.thecvf.com
Ensuring sufficient quality of iris images acquired by handheld imaging devices in visible
light poses many challenges to iris recognition systems. Many distortions affect the input iris …

A local image descriptor based on radial and angular gradient intensity histogram for blurred image matching

B Sadeghi, K Jamshidi, A Vafaei, SA Monadjemi - The Visual Computer, 2019 - Springer
Image rotation and scale change can significantly degrade the efficiency of local descriptors
in blurred image matching. Conventional local image descriptors often only employ the …

Wavelet domain majority coupled binary pattern: a new descriptor for texture classification

S Nithya, S Ramakrishnan - Pattern Analysis and Applications, 2021 - Springer
In this paper, a new approach for texture classification called wavelet domain majority
coupled binary pattern is proposed. Here, the single-level wavelet transform is applied …

Pattern recognition based on compound complex shape-invariant Radon transform

G Hammouda, D Sellami, A Hammouda - The Visual Computer, 2020 - Springer
Radon transform based on complex shape detection is one of the most important challenges
in the field of pattern recognition. Finding a robust transform for extracting and identifying …

Blind Quality Assessment of Iris Images Acquired in Visible Light for Biometric Recognition

M Pedersen, D Saupe - 2020 - ntnuopen.ntnu.no
Image quality is a key issue affecting the performance of biometric systems. Ensuring the
quality of iris images acquired in unconstrained imaging conditions in visible light poses …