E Napoli, AGM Strollo, P Spirito - IEEE Transactions on Power …, 1999 - ieeexplore.ieee.org
The effect of localized lifetime control technique on the static and dynamic behavior of a power PiN diode is investigated in this paper. Mixed mode device circuit simulations are …
F Dugal, E Tsyplakov, A Baschnagel, L Storasta… - Proc. PCIM …, 2012 - academia.edu
We present a newly developed 4500 V and 2000 A Press-Pack IGBT module for power transmission and industrial voltage drives applications. The module employs SPT+ IGBT …
R Kamibaba, M Kaneda, T Takahashi… - 2018 IEEE 30th …, 2018 - ieeexplore.ieee.org
A novel Reverse Conducting IGBT (RC-IGBT) with a low impurity concentration p-anode is proposed. To improve an embedded anti-parallel diode characteristic, a low hole injection …
K Nishiwaki, T Kushida… - … & ICs. IPSD'01 (IEEE Cat …, 2001 - ieeexplore.ieee.org
This paper presents an ultra small reverse recovery charge Qrr diode (USQ-Diode) for Insulated Gate Bipolar Transistor (IGBT) modules. The USQ-Diode has a thin p-layer anode …
W Wu, Y Li, M Yu, C Gao, Y Shu, Y Chen - Micromachines, 2023 - mdpi.com
In this paper, a low switching loss built-in diode of a high-voltage reverse-conducting insulated gate bipolar transistor (RC-IGBT) is proposed without deteriorating IGBT …
K Suzuki, T Yoshida, Y Haraguchi… - … Devices and ICs …, 2021 - ieeexplore.ieee.org
In this paper, low switching loss diode of 600V RC-IGBT is proposed without largely changing wafer process or deteriorating IGBT characteristics by device simulation and real …
A Kopta, M Rahimo… - … European Conference on …, 2007 - ieeexplore.ieee.org
In this paper, a newly developed diode technology platform for 3.3 kV, 4.5 kV and 6.5 kV diodes for next generation high power IGBT modules will be presented. The new diode …
E Napoli, AGM Strollo, P Spirito - Microelectronics journal, 1999 - Elsevier
Local lifetime control and emitter efficiency control techniques and their effect on static and dynamic behavior of power PiN diode are investigated in this article. Mixed-mode device …
K Yoshikawa, M Nemoto, T Fujii - US Patent 6,870,199, 2005 - Google Patents
A semiconductor device that helps to prevent the occurrence of current localization in the vicinity of an electrode edge and improves the reverse-recovery withstanding capability. The …