Hybrid chips to enable a sustainable internet of things technology: opportunities and challenges

K Rogdakis, G Psaltakis, G Fagas, A Quinn, R Martins… - Discover …, 2024 - Springer
A new technological approach is needed for the development of emerging electronic
components and systems within the Internet of Things (IoT) era. New advancements and …

Hybrid Bonding for Ultra-High-Density Interconnect

MC Lu - Journal of Electronic Packaging, 2024 - asmedigitalcollection.asme.org
Hybrid bonding is the technology for interchip ultrahigh-density interconnect at pitch smaller
than 10 μ m. The feasibility at wafer-to-wafer level bonding with bond pad pitch of sub-0.5 μ …

Inorganic temporary direct bonding for collective die to wafer hybrid bonding

F Inoue, S Teranishi, T Iwata, K Onishi… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
A newly developed temporary bonding method for die population on a carrier wafer with
CVD dielectric film has been demonstrated. With this integration approach, the temporary …

Exploring Bonding Mechanism of SiCN for Hybrid Bonding

S Ebiko, S Iacovo, SA Chew, B Zhang… - 2024 IEEE 74th …, 2024 - ieeexplore.ieee.org
The demand for technologies enabling higher performance, greater capacity at lower cost
has been growing. Wafer-to-Wafer hybrid bonding for three-dimensional architectures …

Integration and process challenges of self assembly applied to die-to-wafer hybrid bonding

E Bourjot, A Bond, N Nadi, T Enot… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
We report the integration and process challenges of self assembly in die-to-wafer hybrid
bonding. The bonding quality, step height and Cu integrity are discussed in the context of …

High-reliability Sn37Pb/Sn58Bi composite solder joints by solid-liquid low-temperature soldering

ZT Ye, X Zhao, X Xie, J Chang, W Chen - Materials Today Communications, 2024 - Elsevier
As the feature sizes of integrated circuits approach their physical limits, 3D packaging has
emerged as a crucial technology for enhancing integration and extending Moore's Law. To …

Novel IR laser cleaving for ultra-thin layer transfer and 3D stacked devices

T Uhrmann, P Urban, B Povazay… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
IR laser debonding has been developed enabling the combination of silicon as a carrier
substrate as well as laser debonding through silicon. One solutions is in advanced …

High-performance, power-efficient three-dimensional system-in-package designs with universal chiplet interconnect express

D Das Sharma, G Pasdast, S Tiagaraj, K Aygün - Nature Electronics, 2024 - nature.com
Universal chiplet interconnect express (UCIe) is an open industry standard interconnect for a
chiplet ecosystem in which chiplets from multiple suppliers can be packaged together. The …

Low Temperature Wafer Level Hybrid Bonding Enabled by Advanced SiCN and Surface Activation

F Inoue, A Nagata, J Fuse, S Ebiko… - 2024 IEEE 74th …, 2024 - ieeexplore.ieee.org
Dielectric layer of hybrid bonding is one of the most critical materials for the yield and
reliability because it is the majority of the bonding surface/interface. This paper …

Temporary Direct Bonding by Low Temperature Deposited SiO2 for Chiplet Applications

K Onishi, H Kitagawa, S Teranishi… - ACS Applied …, 2024 - ACS Publications
Die-to-wafer hybrid bonding is a crucial technology in advanced chiplet integration systems.
Temporary die bonding on wafers and subsequent debonding are key aspects of this …