Transmission electron microscopy is an indispensable tool in modern materials science. It
enables the structure of materials to be studied with high spatial resolution, and thus makes …

The progress of electron lens aberration correction from about 1990 onwards is chronicled.
Reasonably complete lists of publications on this and related topics are appended. A …

The goal of this work is to identify favored pathways for preparation of defect-resilient
attached wurtzite CdX (X= S, Se, Te) nanocrystals. We seek guidelines for oriented …

Using in situ high-resolution TEM, we study the structure and dynamics of well-defined edge
dislocations in imperfectly attached PbTe nanocrystals. We identify that attachment of PbTe …

The application of ambient seismic noise cross‐correlation to distributed acoustic sensing
(DAS) data recorded by subsurface fiber‐optic cables has revolutionized our ability to obtain …

Image simulation plays a central role in the development and practice of high-resolution
electron microscopy, including transmission electron microscopy of frozen-hydrated …

Resolution and sensitivity of the latest generation aberration-corrected transmission electron
microscopes allow the vast majority of single atoms to be imaged with sub-Ångstrom …

Reconstruction of the exit wave function is an important route to interpreting high-resolution
transmission electron microscopy (HRTEM) images. Here we demonstrate that convolutional …

Motivated by the need for low electron dose transmission electron microscopy imaging, we
report the optimal frame dose (ie e−/Å 2) range for object detection and segmentation tasks …

Functional behavior can be initiated and captured in series of images with previously
unknown details using a successful effort to effectively control beam–sample interactions in …