[HTML][HTML] Insulated gate and surface passivation structures for GaN-based power transistors

Z Yatabe, JT Asubar, T Hashizume - Journal of Physics D …, 2016 - iopscience.iop.org
Recent years have witnessed GaN-based devices delivering their promise of
unprecedented power and frequency levels and demonstrating their capability as an able …

[HTML][HTML] State of the art on gate insulation and surface passivation for GaN-based power HEMTs

T Hashizume, K Nishiguchi, S Kaneki, J Kuzmik… - Materials science in …, 2018 - Elsevier
In this article, we review recent progress on AlGaN/GaN and InAlN/GaN metal-insulator-
semiconductor high-electron-mobility transistors (MIS-HEMTs) using Al-based oxides, nitride …

[HTML][HTML] Controlling surface/interface states in GaN-based transistors: Surface model, insulated gate, and surface passivation

JT Asubar, Z Yatabe, D Gregusova… - Journal of Applied …, 2021 - pubs.aip.org
Controlling surface/interface states in GaN-based transistors: Surface model, insulated gate,
and surface passivation | Journal of Applied Physics | AIP Publishing Skip to Main Content …

Negative bias-induced threshold voltage instability in GaN-on-Si power HEMTs

M Meneghini, I Rossetto, D Bisi… - IEEE Electron …, 2016 - ieeexplore.ieee.org
This letter reports an in-depth study of the negative threshold voltage instability in GaN-on-Si
metal-insulator–semiconductor high electron mobility transistors with partially recessed …

Performance and VTH Stability in E-Mode GaN Fully Recessed MIS-FETs and Partially Recessed MIS-HEMTs With LPCVD-SiNx/PECVD-SiNx Gate Dielectric …

J He, M Hua, Z Zhang, KJ Chen - IEEE Transactions on Electron …, 2018 - ieeexplore.ieee.org
In this paper, we carried out a systematic comparison between the enhancement-mode GaN-
based fully recessed metal-insulator-semiconductor field-effect transistors (MIS-FETs) and …

Characterization of electronic states at insulator/(Al) GaN interfaces for improved insulated gate and surface passivation structures of GaN-based transistors

Z Yatabe, Y Hori, WC Ma, JT Asubar… - Japanese Journal of …, 2014 - iopscience.iop.org
This paper presents a systematic characterization of electronic states at insulators/(Al) GaN
interfaces, particularly focusing on insulator/AlGaN/GaN structures. First, we review …

Current linearity and operation stability in Al2O3-gate AlGaN/GaN MOS high electron mobility transistors

K Nishiguchi, S Kaneki, S Ozaki… - Japanese Journal of …, 2017 - iopscience.iop.org
To investigate current linearity and operation stability of metal–oxide–semiconductor (MOS)
AlGaN/GaN high electron mobility transistors (HEMTs), we have fabricated and …

[HTML][HTML] Status of aluminum oxide gate dielectric technology for insulated-gate GaN-based devices

A Calzolaro, T Mikolajick, A Wachowiak - Materials, 2022 - mdpi.com
Insulated-gate GaN-based transistors can fulfill the emerging demands for the future
generation of highly efficient electronics for high-frequency, high-power and high …

A crystalline oxide passivation for Al2O3/AlGaN/GaN

X Qin, H Dong, J Kim, RM Wallace - Applied Physics Letters, 2014 - pubs.aip.org
In situ X-ray photoelectron spectroscopy and low energy electron diffraction are performed to
study the formation of a crystalline oxide on the AlGaN surface. The oxidation of the AlGaN …

Ferroelectric gate AlGaN/GaN E-mode HEMTs with high transport and sub-threshold performance

J Zhu, L Chen, J Jiang, X Lu, L Yang… - IEEE Electron …, 2017 - ieeexplore.ieee.org
This letter demonstrated AlGaN/GaN enhancement-mode (E-mode) high-electron-mobility
transistors (HEMTs) with 30-nm Pb (Zr, Ti) O 3 ferroelectric gate dielectric. The high-quality …