Optimized multitone test stimulus driven diagnosis of RF transceivers using model parameter estimation

A Banerjee, V Natarajan, S Sen… - … Conference on VLSI …, 2011 - ieeexplore.ieee.org
Test time and test complexity reduction has become a critical challenge in modern RF
testing. Prior “alternative” test methods have achieved fast testing at the cost of using …

Digital-Based Solution for the Generation of FM/pm Test Stimuli

K Tahraoui, T Vayssade, F Lefèvre… - … on Computer-Aided …, 2024 - ieeexplore.ieee.org
This paper explores a low-cost solution for generating modulated test stimuli using a
standard digital Automated Test Equipment (ATE). The technique relies on the generation of …

Phase-aware multitone digital signal based test for RF receivers

MA Zeidan, G Banerjee, R Gharpurey… - IEEE Transactions on …, 2012 - ieeexplore.ieee.org
This paper presents a method for testing RF receivers that utilizes a multitone digital signal
generation scheme and relies on the analysis of the receiver baseband output to compute …

Exploration of a digital-based solution for the generation of 2.4 GHz OQPSK test stimuli

T Vayssade, M Chehaitly, F Azais… - 2021 IEEE European …, 2021 - ieeexplore.ieee.org
In this paper, we explore a digital-based solution for the generation of 2.4 GHz OSQSK test
stimuli. The objective is to reduce the testing costs of ZigBee receivers by enabling their test …

Digital generation of RF phase-modulated test stimuli: application to BPSK modulation scheme

K Tahraoui, R Burelle, T Vayssade… - … on Defect and Fault …, 2024 - ieeexplore.ieee.org
This paper presents an original strategy for low-cost generation of Radio-Frequency (RF)
phase-modulated test stimuli using a standard digital Automated Test Equipment (ATE). The …

Automatic test stimulus generation for diagnosis of RF transceivers using model parameter estimation

A Banerjee, A Chatterjee - IEEE Transactions on Very Large …, 2015 - ieeexplore.ieee.org
In this brief, an optimized test stimulus generation technique is proposed for model
parameter computation-based diagnosis and testing, which can provide a very compact …

BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting

S Sen, A Banerjee, V Natarajan, S Devarakond… - Journal of Electronic …, 2012 - Springer
Abstract Testing of Radio Frequency (RF) circuits for nonlinearity specifications generally
requires the use of multiple test measurements thereby contributing to increased test cost …

[图书][B] Design of process and environment adaptive ultra-low power wireless circuits and systems

S Sen - 2011 - search.proquest.com
The explosive growth of portable battery operated devices has mandated design of low
power circuits and systems to prolong battery life. These devices fabricated in modern …

Low cost implicit built-in self-test of passive RFID Tags

S Banerjee, D Banerjee, A Banerjee… - … , and Systems Test …, 2014 - ieeexplore.ieee.org
Testing of RFID Tags is complicated by the fact that the RFID chips must be tested both
before and after antenna attach. The test procedure prior to chip attach must ensure, to the …

Analyse de signaux analogiques/radiofréquences à l'aide de ressources digitales en vue du test

N Pous - 2011 - theses.hal.science
Les travaux présentés dans ce mémoire entrent dans le cadre de la réduction des coûts de
production des circuits RF. En effet, la démocratisation de ces appareils pousse les …