A review of mechanical properties of lead-free solders for electronic packaging

H Ma, JC Suhling - Journal of materials science, 2009 - Springer
The characterization of lead-free solders, especially after isothermal aging, is very important
in order to accurately predict the reliability of solder joints. However, due to lack of …

Influence of nanoparticle addition on the formation and growth of intermetallic compounds (IMCs) in Cu/Sn–Ag–Cu/Cu solder joint during different thermal conditions

AT Tan, AW Tan, F Yusof - Science and technology of advanced …, 2015 - iopscience.iop.org
Nanocomposite lead-free solders are gaining prominence as replacements for conventional
lead-free solders such as Sn–Ag–Cu solder in the electronic packaging industry. They are …

Interfacial reaction issues for lead-free electronic solders

KN Subramanian, CE Ho, SC Yang, CR Kao - Lead-Free Electronic …, 2007 - Springer
The interfacial reactions between Sn-based solders and two common substrate materials,
Cu and Ni, are the focuses of this paper. The reactions between Sn-based solders and Cu …

Reliability of the aging lead free solder joint

H Ma, JC Suhling, P Lall… - 56th Electronic …, 2006 - ieeexplore.ieee.org
Solder materials demonstrate evolving microstructure and mechanical behavior that
changes significantly with environmental exposures such as isothermal aging and thermal …

The influence of elevated temperature aging on reliability of lead free solder joints

H Ma, JC Suhling, Y Zhang, P Lall… - 2007 Proceedings …, 2007 - ieeexplore.ieee.org
The microstructure, mechanical response, and failure behavior of lead free solder joints in
electronic assemblies are constantly evolving when exposed to isothermal aging and/or …

Reduction of lead free solder aging effects using doped SAC alloys

Z Cai, Y Zhang, JC Suhling, P Lall… - 2010 Proceedings …, 2010 - ieeexplore.ieee.org
The microstructure, mechanical response, and failure behavior of lead free solder joints in
electronic assemblies are constantly evolving when exposed to isothermal aging and/or …

Growth behavior of intermetallic compounds and early formation of cracks in Sn-3Ag-0.5 Cu solder joints under extreme temperature thermal shock

R Tian, C Hang, Y Tian, L Zhao - Materials Science and Engineering: A, 2018 - Elsevier
The microstructure evolution and growth mechanism of interfacial intermetallic compounds
(IMCs) as well as the mechanism for early formation of cracks in Sn-3Ag-0.5 Cu solder joints …

The effects of aging temperature on SAC solder joint material behavior and reliability

Y Zhang, Z Cai, JC Suhling, P Lall… - 2008 58th Electronic …, 2008 - ieeexplore.ieee.org
The effects of aging on mechanical behavior of lead free solders have been examined by
performing creep tests on four different SAC alloys (SAC105, SAC205, SAC305, SAC405) …

Thermal aging effects on the thermal cycling reliability of lead-free fine pitch packages

J Zhang, Z Hai… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
The microstructure, mechanical response, and failure behavior of lead-free solder joints in
electronic assemblies are constantly evolving when exposed to isothermal aging and/or …

The effects of aging on the cyclic stress-strain behavior and hysteresis loop evolution of lead free solders

M Mustafa, Z Cai, JC Suhling… - 2011 IEEE 61st Electronic …, 2011 - ieeexplore.ieee.org
Solder joints in electronic assemblies are typically subjected to thermal cycling, either in
actual application or in accelerated life testing used for qualification. Mismatches in the …