Gas desorption and electron emission from 1 MeV potassium ion bombardment of stainless steel

AW Molvik, MK Covo, FM Bieniosek, L Prost… - Physical Review Special …, 2004 - APS
Gas desorption and electron emission coefficients were measured for 1 MeV potassium ions
incident on stainless steel at grazing angles (between 80° and 88° from normal incidence) …

Improvement of the detection efficiency of a time-of-flight detector for superheavy element search

S Ishizawa, K Morimoto, D Kaji, T Tanaka… - Nuclear Instruments and …, 2020 - Elsevier
A time-of-flight (TOF) detector with a large entrance foil (effective area of 154 cm 2) was
developed as part of the detection system to search for new elements of Z= 119 and beyond …

Correlation between multiple ionization and fragmentation of in charge-changing collisions with

T Majima, T Murai, T Kishimoto, Y Adachi, SO Yoshida… - Physical Review A, 2014 - APS
We investigate correlations between multiple ionization and fragmentation processes of the
ethane molecule in collisions with 580-keV C+ ions under single-electron capture and loss …

[HTML][HTML] Proton-induced secondary electron emission from elemental solids over the energy domain 1 keV–1000 MeV

AKF Haque, MM Haque, S Sultana, MAR Patoary… - Results in Physics, 2019 - Elsevier
We propose a new model to calculate the proton-induced secondary electron yield (SEY)
from elemental solids. The model combines the stopping power formula generated by …

Single-particle detection of products from atomic and molecular reactions in a cryogenic ion storage ring

C Krantz, O Novotný, A Becker, S George… - Nuclear Instruments and …, 2017 - Elsevier
We have used a single-particle detector system, based on secondary electron emission, for
counting low-energetic (∼ keV/u) massive products originating from atomic and molecular …

Correlation between multiple ionization and fragmentation of in collisions: Evidence for fragmentation induced by internal excitation

T Majima, Y Nakai, H Tsuchida, A Itoh - Physical Review A—Atomic, Molecular …, 2004 - APS
Fragment ions from C 60 induced by 2 MeV (v= 1.7 au) Si 2+ impacts are measured in
coincidence with the number distributions of secondary electrons under conditions of single …

Dependence of secondary electron emission on the emergent angle of 2.5-MeV protons penetrating a thin carbon foil

H Ogawa, H Tsuchida, N Sakamoto - Physical Review A, 2003 - APS
Abstract With 2.5-MeV proton beams incident on a carbon foil of 1.8 μ g/cm 2 in thickness,
the statistical distributions of the number of simultaneously emitted secondary electrons …

Secondary electron yield of Au and Al2O3 surfaces from swift heavy ion impact in the 2.5–7.9 MeV/amu energy range

D Bisello, A Candelori, P Giubilato, A Kaminsky… - Nuclear Instruments and …, 2008 - Elsevier
We report on the secondary electron yields of Au and oxidized aluminum (Al2O3) by impact
of heavy ions with energies ranging from 7.92 MeV/amu (12C6) to 2.54 MeV/amu …

Emission statistics of X-ray induced photoelectrons and its comparison with electron-and ion-induced electron emissions

K Ohya, K Inai, A Nisawa, A Itoh - … Methods in Physics Research Section B …, 2008 - Elsevier
The emission statistics of secondary electrons from a gold metal surface induced by
monochromatic X-rays is studied by Monte Carlo simulations. The number distributions of …

Characterization of secondary ion emission processes of sub-MeV C60 ion impacts via analysis of statistical distributions of the emitted ion number

K Hirata, K Yamada, A Chiba, K Narumi… - The Journal of Chemical …, 2016 - pubs.aip.org
We report probability distributions of the number of secondary ions (SIs) emitted by sub-MeV
C 60 ion impacts on an organic polymer target and the characterization of their emission …