The availability of access to Integrated Circuits' scan chain is an inevitable requirement of
modern ICs for testability/debugging purposes. However, leaving access to the scan chain …

Scan chains increase the testability but decrease security. Attackers may use scan chains to
launch attacks to obtain sensitive information, which poses serious security threats. The …

Scan based DfT is indispensable for IC testing in the semiconductor chip industry to ensure
correctness of chip, both functionally and structurally. Since a higher degree of fault …

Scan-based side-channel attacks have become a severe threat to the security of
cryptographic chips and locking mechanisms are one of the most effective methods against …

Scan chain design facilitates chip testing by providing an interface for the test engineers to
access and control the internal states of the circuit. This feature has also been exploited to …

Having access to the scan chain of Integrated Circuits (ICs) is an integral requirement of the
debug/testability process within the supply chain. However, the access to the scan chain …

The availability of access to integrated circuits' scan chain is an inevitable requirement of
modern ICs for testability/debugging purposes. However, leaving open access to the scan …

Sean-based Design-for-Test (DIT) infrastructure renders an ASIC design testable by making
internal circuit nodes more controllable and observable. It, however, vastly conflicts with the …

The demand for cryptographic chips is growing rapidly in the market nowadays. Chips must
undergo rigorous testing in order to promote quality. Scan-based design for testability (DFT) …