Science-based, data-driven developments in plasma processing for material synthesis and device-integration technologies

M Kambara, S Kawaguchi, HJ Lee… - Japanese Journal of …, 2022 - iopscience.iop.org
Low-temperature plasma-processing technologies are essential for material synthesis and
device fabrication. Not only the utilization but also the development of plasma-related …

In Situ Monitoring of Etching Characteristic and Surface Reactions in Atomic Layer Etching of SiN Using Cyclic CF4/H2 and H2 Plasmas

SN Hsiao, M Sekine, M Hori - ACS Applied Materials & Interfaces, 2023 - ACS Publications
Cyclic atomic layer etching (ALE) of SiN with high selectivity to SiO2, utilizing a
hydrofluorocarbon deposition followed by exposure to hydrogen plasma, is presented. The …

Foundations of plasma standards

LL Alves, MM Becker, J van Dijk, T Gans… - Plasma Sources …, 2023 - iopscience.iop.org
The field of low-temperature plasmas (LTPs) excels by virtue of its broad intellectual
diversity, interdisciplinarity and range of applications. This great diversity also challenges …

In Situ Monitoring Surface Reactions in Cryogenic Atomic Layer Etching of Silicon Nitride by Alternating Surface Modification with Hydrogen Fluoride Dose and Ar …

SN Hsiao, M Sekine, Y Iijima, M Hori - Chemistry of Materials, 2024 - ACS Publications
Cryogenic atomic layer etching (ALE) represents a promising technique for achieving
subnanoscale material removal in semiconductor processes, owing to its unique self-limiting …

Assessing neutral transport mechanisms in aspect ratio dependent etching by means of experiments and multiscale plasma modeling

P Vanraes, SP Venugopalan, M Besemer… - … Sources Science and …, 2023 - iopscience.iop.org
Since the onset of pattern transfer technologies for chip manufacturing, various strategies
have been developed to circumvent or overcome aspect ratio dependent etching (ARDE) …

[HTML][HTML] Origin of enhanced thermal atomic layer etching of amorphous HfO2

R Mullins, JJ Gutiérrez Moreno, M Nolan - Journal of Vacuum Science …, 2022 - pubs.aip.org
HfO 2 is a high-k material that is used in semiconductor devices. Atomic-level control of
material processing is required for the fabrication of thin films of high-k materials at …

Atomic Layer Etching Using a Novel Radical Generation Module

J Jung, K Kim - Materials, 2023 - mdpi.com
To fabricate miniature semiconductors of 10 nm or less, various process technologies have
reached their physical limits, and new process technologies for miniaturization are required …

Electron bias control signals for electron enhanced material processing

SF Sando, SJ Anz, DI Margolese… - US Patent …, 2023 - Google Patents
Abstract Systems and methods for material processing using wafer scale waves of precisely
controlled electrons in a DC plasma is presented. A surface floating potential of a substrate …

DC plasma control for electron enhanced material processing

WA Goddard, SF Sando, SJ Anz… - US Patent …, 2023 - Google Patents
Systems and methods for material processing using wafer scale waves of precisely
controlled electrons in a DC plasma is presented. The anode and cathode of a DC plasma …

DC plasma control for electron enhanced material processing

WA Goddard, SF Sando, SJ Anz… - US Patent …, 2023 - Google Patents
Abstract Systems and methods for material processing using wafer scale waves of precisely
controlled electrons in a DC plasma is presented. The anode and cathode of a DC plasma …