Owing to the lack of feasible fault modeling method, hard (open and short) faults, and
discretized parametric faults are still the mostly used fault models. These models cannot …

Owing to the lack of feasible fault modeling method, hard (open and short) faults and
discrete parameter faults are still the mostly used fault models. These models cannot …

Fault diagnosis is very important for development and maintenance of safe and reliable
electronic circuits and systems. This paper describes an approach of soft fault diagnosis for …

The methodology to computer-aided design-for-testability (DFT) of mixed-signal IC is
proposed. Functional model of DFT-automation is presented as IDEF0-diagram based on …

The technique of functional testing the analog integrated circuits based on neuromorphic
classifier (NC) has been proposed. The structure of NC providing detection both catastrophic …

Combining the time and frequency location and multiple-scale analysis of wavelet transform
with the nonlinear mapping and generalizing of neural network, an efficient defect-oriented …

Предложен метод функционального тестирования аналоговых интегральных
микросхем на основе нейросетевого сигнатурного анализатора (НСА). Представлена …

The methodology of design-for-testability automation of mixed-signal IC is proposed.
Functional model of DFT automation is presented as IDEF0-diagram based on the system …

Предложена методика тестопригодного проектирования аналого-цифровых схем с
использованием параллелизма, поддерживающего одновременное выполнение …

This paper describe fault diagnosis of RC-Coupled amplifier using slope fault feature. These
slope fault feature technique utilized to construct the fault dictionary for RC-Coupled …