Development of hafnium based high-k materials—A review

JH Choi, Y Mao, JP Chang - Materials Science and Engineering: R: Reports, 2011 - Elsevier
The move to implement metal oxide based gate dielectrics in a metal-oxide-semiconductor
field effect transistor is considered one of the most dramatic advances in materials science …

Review on analog/radio frequency performance of advanced silicon MOSFETs

V Passi, JP Raskin - Semiconductor Science and Technology, 2017 - iopscience.iop.org
Aggressive gate-length downscaling of the metal-oxide-semiconductor field-effect transistor
(MOSFET) has been the main stimulus for the growth of the integrated circuit industry. This …

X-ray Photoelectron Spectroscopy Depth Profiling of La2O3/Si Thin Films Deposited by Reactive Magnetron Sputtering

CV Ramana, RS Vemuri, VV Kaichev… - … applied materials & …, 2011 - ACS Publications
The La2O3/Si thin films have been deposited by reactive DC magnetron sputtering.
Amorphous state of La2O3 layer has been shown by RHEED observation. Top surface …

Sm 2 O 3 and Sm 2 O 3-based nanostructures for photocatalysis, sensors, CO conversion, and biological applications

MM Khan, SN Matussin - Catalysis Science & Technology, 2023 - pubs.rsc.org
Metal oxide nanoparticles have gained popularity owing to their unique properties. Recently,
metal oxides, particularly rare-earth metal oxides, have been explored and used in several …

A quasi-passivated film formed on as-solutionized Mg-Sm-Zn-Zr alloy in NaCl solution

YJ Feng, Q Li, TL Zhao, FS Pan - Corrosion Science, 2022 - Elsevier
Benefiting from a quasi-passivated film, as-solutionized Mg-Sm-Zn-Zr alloy exhibits an
extraordinary corrosion resistance over currently reported Mg alloys. The breakdown …

Effect of gate dielectric thicknesses on MOS photodiode performance and electrical properties

ET Salim, AI Hassan, SA Naaes - Materials Research Express, 2019 - iopscience.iop.org
Different film thickness was used to investigate the effect of the Al 2 O 3 as a dielectric
material for the fabrication of Al/AL 2 O 3/Si/Al MOS diode. Chemical spray pyrolysis method …

Role of the dielectric for the charging dynamics of the dielectric/barrier interface in AlGaN/GaN based metal-insulator-semiconductor structures under forward gate …

P Lagger, P Steinschifter, M Reiner… - Applied Physics …, 2014 - pubs.aip.org
The high density of defect states at the dielectric/III-N interface in GaN based metal-insulator-
semiconductor structures causes tremendous threshold voltage drifts, ΔV th, under forward …

Lanthanide rare earth oxide thin film as an alternative gate oxide

KH Goh, A Haseeb, YH Wong - Materials Science in Semiconductor …, 2017 - Elsevier
An ultrathin gate oxide is needed for future nanoscale technology due to the density of
integrated circuits will increase exponentially every two to three years as predicted by …

A highly efficient rare earth metal oxide nanorods based platform for aflatoxin detection

J Singh, A Roychoudhury, M Srivastava… - Journal of Materials …, 2013 - pubs.rsc.org
The nanostructured rare earth metal oxide (samarium oxide, n-Sm2O3) nanorods, prepared
using a forced hydrolysis technique, have been electrophoretically deposited (EPD) onto an …

Sm2O3 gate dielectric on Si substrate

WC Chin, KY Cheong, Z Hassan - Materials science in semiconductor …, 2010 - Elsevier
High dielectric constant (κ) materials have become a necessity for down scaling of metal-
oxide-semiconductor (MOS) based devices. Rare-earth oxides have been studied as …