A Comparative Study of Semiconductor Virtual Metrology Methods and Novel Algorithmic Framework for Dynamic Sampling

X Han, M Miller, J Moyne, GW Vogl… - IEEE Transactions …, 2025 - ieeexplore.ieee.org
Virtual metrology (VM) is an important technology in semiconductor manufacturing that
enhances process control, reduces costs, and improves quality. However, as processes …

The Value of In-Line Metrology for Advanced Process Control: AM: Advanced Metrology

J Lee, MYH Kim, Y Eun - 2024 35th Annual SEMI Advanced …, 2024 - ieeexplore.ieee.org
In-line metrology provides critical information for feedback and feedforward process control.
In high-volume manufacturing, the fundamental question is: how fast, how frequent, and how …

Model aggregation for virtual metrology in high-volume manufacturing

M Shin, M Jung, S Zabrocki, DH Ro… - … and Process Control …, 2024 - spiedigitallibrary.org
Virtual metrology (VM) plays a pivotal role in enhancing productivity, improving quality, and
reducing maintenance costs in semiconductor manufacturing by replacing traditional …