Radiation Hardened by Design (RHBD) is one of the main measures for solving the soft
error issue in digital circuits. However, a multi-objective optimization (MOO) problem …

Soft errors in large VLSI circuits have a significant impact on computing-and memory-
intensive neural network (NN) processing. Understanding the influence of soft errors on NNs …

This paper investigated the soft errors caused by particle strikes, such as high-energy
neutrons, extending beyond the deep submicrometer era. Considering the structure of the …

Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft
error rate (SER) estimation has become an important and very challenging goal. In this work …

Soft errors in combinational logic circuits are emerging as a significant reliability concern for
nanoscale VLSI designs. This paper presents a novel sensitivity-based gate sizing …

With the continuous scaling-down of transistors, the soft error issue of the combinational
circuit becomes more serious. Triple Modular Redundancy (TMR) and Gate-Sizing (GS) are …

Cosmic radiation resulting in transient faults to the combinational logic of Integrated Circuits
(ICs), constitutes a major reliability concern for space applications. In addition, continuous …

A considerable disadvantage that comes with the downscaling of the CMOS technology is
the ever-increasing susceptibility of Integrated Circuits (ICs) to soft errors. Therefore, the …

Nanometer integrated circuits are getting increasingly vulnerable to soft errors and making
the soft error rate (SER) estimation an important challenge. In this study, a novel approach is …

Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of
the increased vulnerability brought by technology scaling. This paper presents a …