Run-time solutions based on online monitoring and adaptation are required for resilience in
nanoscale integrated circuits, as design-time solutions and guard bands are no longer …

The proposed paper addresses the overarching reliability issue of transistor aging in
nanometer-scaled circuits. Specifically, a comprehensive survey and taxonomy of …

With the semiconductor manufacturing technology approaching to 14 nm and below, the
reliability of IC is challenged, as the speed of CMOS or FinFET is degraded by the aging …

At nanometer manufacturing technology nodes, process variations affect circuit performance
significantly. This trend leads to a large timing margin and thus overdesign in the traditional …

Run-time solutions based on real-time monitoring and adaptation are required for resilience
in nanoscale integrated circuits as design-time solutions and guard bands are no longer …

Commercial off-the-shelf (COTS) field-programmable gate arrays (FPGAs) with a 28-nm
process have become popular devices for computing systems. Although current generation …

This paper presents a two-step aging-aware methodology for Representative Critical Paths
(RCPs) selection from a large number of Critical Paths (CPs) in programmable logic devices …

One of the fundamental challenges to the performance gain in advanced semiconductor
technology is aging-induced delay degradation of transistors, which consequently increases …

Lifetime reliability management of miniaturized CMOS devices continuously gets more
importance with the shrinking of technology size. Neither of existing design-time solutions …

Circuit delays are increasingly sensitive to process, voltage, temperature, and aging (PVTA)
variations, severely impacting circuit performance. Accurate measurement of circuit delay is …