Odyssey of the charge pumping technique and its applications from micrometric-to atomic-scale era
B Djezzar - Journal of Applied Physics, 2023 - pubs.aip.org
This paper reviews the evolution of the charge pumping (CP) technique and its applications
from the micrometer-scale to the atomic-scale device era. We describe the more significant …
from the micrometer-scale to the atomic-scale device era. We describe the more significant …
Electron emission from deep traps in under thermal and optical excitation
The ratio between the energies of optical and thermal ionization depends on the defect
nature and the strength of the interaction of trapped electrons with phonons. Knowing this …
nature and the strength of the interaction of trapped electrons with phonons. Knowing this …
Application of Charge Pumping Technique for MOSFET Devices Reliability
B Djezzar - 2023 IEEE 33rd International Conference on …, 2023 - ieeexplore.ieee.org
In this paper, we present an overview of charge-pumping technique (CPT) and its
applications in field-effect transistors (FET) reliability during couple of decades, giving …
applications in field-effect transistors (FET) reliability during couple of decades, giving …
Relationship between Trapping Centers, Charge Pumping, and Leakage Currents in Hot-Carrier-Stressed Si/SiO2/HfO2 Transistors
We identify two distinct atomic-scale defect responses following hot carrier stressing of HfO 2
based metal-oxide-semiconductor field-effect transistors (MOSFETs). Revealed through …
based metal-oxide-semiconductor field-effect transistors (MOSFETs). Revealed through …