Design and evaluation of multiple valued logic gates using pseudo N-type carbon nanotube FETs

J Liang, L Chen, J Han… - IEEE transactions on …, 2014 - ieeexplore.ieee.org
Multiple valued logic (MVL) circuits are particularly attractive for nanoscale implementation
as advantages in information density and operating speed can be harvested using emerging …

Carbon nanotube robust digital VLSI

J Zhang, A Lin, N Patil, H Wei, L Wei… - … on Computer-Aided …, 2012 - ieeexplore.ieee.org
Carbon nanotube field-effect transistors (CNFETs) are excellent candidates for building
highly energy-efficient electronic systems of the future. Fundamental limitations inherent to …

A multi-sample, multi-tree approach to bag-of-words image representation for image retrieval

Z Wu, Q Ke, J Sun, HY Shum - 2009 IEEE 12th International …, 2009 - ieeexplore.ieee.org
The state-of-the-art content based image retrieval systems has been significantly advanced
by the introduction of SIFT features and the bag-of-words image representation. Converting …

Variability and reliability analysis of CNFET technology: Impact of manufacturing imperfections

CG Almudever, A Rubio - Microelectronics Reliability, 2015 - Elsevier
Carbon nanotube field-effect transistors (CNFETs) are promising candidates to substitute
silicon transistors. Boasting extraordinary electronic properties, CNFETs exhibit …

Carbon nanotube circuits: Opportunities and challenges

H Wei, M Shulaker, G Hills, HY Chen… - … , Automation & Test …, 2013 - ieeexplore.ieee.org
Carbon Nanotube Field-Effect Transistors (CNFETs) are excellent candidates for building
highly energy-efficient digital systems. However, imperfections inherent in carbon nanotubes …

Hybrid CMOS and CNFET power gating in ultralow voltage design

KK Kim, YB Kim, K Choi - IEEE Transactions on …, 2011 - ieeexplore.ieee.org
This paper proposes a new hybrid MOSFET/carbon nanotube FET (CNFET) power-gating
(PG) method using 32 nm technology in the ultralow-voltage region (~ 0.4 V). Traditionally …

Design of quaternary 4–2 and 5–2 compressors for nanotechnology

F Sharifi, A Panahi, H Sharifi, K Navi… - Computers & Electrical …, 2016 - Elsevier
Abstract Recently, Multiple Valued Logic (MVL) has attracted attention, because it reduces
the area and complexity of circuits when compared to binary logic. Carbon nanotube field …

Optimum reliability sizing for complementary metal oxide semiconductor gates

W Ibrahim, V Beiu, A Beg - IEEE Transactions on Reliability, 2012 - ieeexplore.ieee.org
Introducing redundancy at the device-level has been proposed as the most effective way to
improve reliability. With the remarkable reliability of the complementary metal oxide …

Stochastic analysis and design guidelines for CNFETs in gigascale integrated systems

P Zarkesh-Ha, AAM Shahi - IEEE Transactions on Electron …, 2010 - ieeexplore.ieee.org
An integrated and compact model for probability of failure in carbon nanotube field-effect
transistors (CNFETs) that includes 1) void CNFETs, 2) carbon nanotube (CNT) density …

Comparison of variations in MOSFET versus CNFET in gigascale integrated systems

AAM Shahi, P Zarkesh-Ha… - … Symposium on Quality …, 2012 - ieeexplore.ieee.org
Using previously developed model for CNT density variation in CNFETs and random dopant
fluctuation model in MOSFET, we compared and presented overall device variations in …