Recent advances in displacement measuring interferometry

N Bobroff - Measurement Science and Technology, 1993 - iopscience.iop.org
The present state of high-resolution displacement measuring interferometry is reviewed.
Factors which determine the accuracy, linearity and repeatability of nanometre-scale …

Simple, high‐resolution interferometer for the measurement of frequency‐dependent complex piezoelectric responses in ferroelectric ceramics

JF Li, P Moses, D Viehland - Review of scientific instruments, 1995 - pubs.aip.org
In this paper, we report the development of a simple but precise piezoelectric spectrometer
using a Michelson–Morley interferometer. The measurement system has been developed to …

Dual mode phase measurement for optical heterodyne interferometry

NB Yim, CI Eom, SW Kim - Measurement Science and …, 2000 - iopscience.iop.org
We present a new digital phase measuring scheme for optical heterodyne interferometry,
which provides high measurable velocity up to 6 m s-1 with a fine displacement resolution of …

Displacement measuring technique for satellite-to-satellite laser interferometer to determine Earth's gravity field

S Nagano, T Yoshino, H Kunimori… - Measurement …, 2004 - iopscience.iop.org
We present a new displacement measuring technique with simplicity, robustness, high
sensitivity and wide measurement range. A set of a frequency shifter and a voltage …

Two-way frequency-conversion phase measurement for high-speed and high-resolution heterodyne interferometry

MS Kim, SW Kim - Measurement Science and Technology, 2004 - iopscience.iop.org
He–Ne heterodyne laser interferometers are widely used as standard tools for displacement
metrology to produce high-resolution measurements. However, such systems use specially …

Phase difference determination by fringe pattern matching

Z Wang, PJ Bryanston-Cross, DJ Whitehouse - Optics & Laser Technology, 1996 - Elsevier
A method of phase difference determination in interferometry is presented. In this method,
the phase difference between two interferograms is determined by fringe pattern matching …

Phase-shifted image matching algorithm for displacement measurement

Z Wang, MS Graca, PJ Bryanston-Cross… - Optical …, 1996 - spiedigitallibrary.org
An algorithm of phase-shifted image matching for the measurement of displacement from
interferometric images is presented. The algorithm is capable of detecting the displacements …

Calibrated measurement of the behaviour of mechanical junctions from micrometre to subnanometre scale: the friction force scanner

D Sidobre, V Hayward - Measurement Science and Technology, 2004 - iopscience.iop.org
We describe an instrument called a friction force scanner (FFS) able to perform calibrated
measurements of the behaviour of mechanical junctions with more than four orders of …

Heterodyne laser Doppler vibrometer using a Zeeman-stabilized He–Ne laser with a one-shot frequency to voltage converter

J La, H Choi, K Park - Review of scientific instruments, 2005 - pubs.aip.org
The vibration measurement technique using a heterodyne laser interferometer is addressed
in this article. A Zeeman-stabilized He–Ne laser is used as the light source. The frequency …

Insitu measurement of large piezoelectric displacements in resonant atomic force microscopy

S Hudlet, M Saint Jean, D Royer, J Berger… - Review of scientific …, 1995 - pubs.aip.org
In resonant atomic force microscopy (AFMR) the calibration of the tip–sample relative
displacement remains a major problem. Commonly used PZT piezoceramics exhibit a …