Because of the rapid increase in commercially available Fourier transform infrared
spectrometers and computers over the past ten years, it has now become feasible to use IR …

Fourier transform infrared absorption spectroscopy has been utilized to characterize the
structure of porous silica gel films, both deposited on c‐Si substrates and free standing. The …

The infrared-reflectance spectra of silica glasses were measured and analyzed with a
Kramers-Kronig transformation for a better understanding of the response of silica …

A comparison of infrared spectroscopic analytical approaches was made in order to assess
their applicability for internal structure characterization of SiO 2 thin films. Markers for …

Infrared spectroscopy has been used to analyze the structural changes in samples prepared
by the sol-gel method. Silica gels were prepared from alcoholic solutions of …

In~ rared spectroscopy was employed to characterize thermal SiOz layers down to 15 nrn~
hl~ kness. From t~ ese measur~ rnents, performed in transmission mode under a 30· angle …

The structure of thin (∼ 300nm) SiO x N y (0.23≤ x≤ 1.95, 0.01≤ y≤ 0.32) films produced
by plasma enhanced chemical vapor deposition is studied by infrared (IR) spectroscopy …

We describe the synthesis, materials characterization, and dynamic nuclear polarization
(DNP) of amorphous and crystalline silicon nanoparticles for use as hyperpolarized …

The structure of thermally groen thin (0.01–1.2 μm) SiO 2 films is studied using IR
spectroscopy and computer analysis of the spectrum line shape. Deconvolution of the silicon …

Weblike aggregates of coalesced Si nanocrystals are produced by a laser vaporization−
controlled condensation technique. SEM micrographs show particles with∼ 10 nm diameter …