Fault diagnosis is one of the most important phases in the VLSI design cycle. This paper
proposes a probabilistic solution for the fault diagnosis in the sequential scan-based circuits …

A new adaptive thresholding power management (ATPM) scheme is proposed to maximize
the data rate of RF circuits in distributed embedded systems powered by renewable energy …

By advances in technology, integrated circuits have come to include more functionality and
more complexity in a single chip. Although methods of testing have improved, but the …

With ever advancing in digital system, security has been emerged as a major concern. Many
researchers all around the world come up with solutions to address various challenges that …

Along with advances in modern VLSI technology, delay faults are becoming ever more
important. On the other hand, the strength of SAT-solver engines has made them an …

Verification is the procedure to check if there is a discrepancy between a design and its
specification. Debugging target is to find the location of the observed error (s). Correction …

This paper presents a hybrid history-based test generation mechanism that intermittently
applies partial-test vectors to reduce test application time. Test generation is done by looking …