AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires
Silicon nanowires (NWs) with a cylindrical form are fabricated by means of nanosphere
lithography and metal-assisted chemical etching to obtain high aspect ratio nanostructures …
lithography and metal-assisted chemical etching to obtain high aspect ratio nanostructures …
[HTML][HTML] Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader's formula for …
This paper investigates the experimental parameters of the Sader's formula, to calculate the
spring constant of cantilevers used in Atomic Force Microscopy (AFM), with the related …
spring constant of cantilevers used in Atomic Force Microscopy (AFM), with the related …
[HTML][HTML] SurfILE: An Open-Source Python Package for Surface Topography Analysis
Surface metrology deals with inspecting surfaces and profiles by using contact or non-
contact profilometers. In this field, the characterization of the dimensional, morphological …
contact profilometers. In this field, the characterization of the dimensional, morphological …