The connection between laser‐based material processing and additive manufacturing is
quite deeply rooted. In fact, the spark that started the field of additive manufacturing is the …

Atom probe tomography is unique in its ability to image in 3D at the atomic scale and
measure composition in a semiconductor device with high sensitivity. However it suffers from …

Reconstructions in atom probe tomography (APT) are biased by image distortions arising
from dynamic changes of the specimen geometry that controls image projection. Despite the …

Reliable spatially resolved compositional analysis through atom probe tomography requires
an accurate placement of the detected ions within the three-dimensional reconstruction …

Manipulation of laser-assisted field evaporation taking place at a sub-picosecond time scale
relies on a full understanding of the dynamics at a microscopic level. We use first-principles …

To understand laser-assisted field evaporation of semiconductors and insulators at the
microscopic level, we study the time evolution of the electronic and atomic structure of a …

The charge state of an ion field-evaporating from a silicon-atom cluster is analyzed using
time-dependent density functional theory coupled to molecular dynamics. The final charge …

Current issues associated with laser-assisted atom probe tomography of insulators are
addressed by investigating laser-induced carrier dynamics and field evaporation kinetics. It …

Les lasers ultra-rapides fibrés sont aujourd'hui incontournables dans de nombreuses
applications industrielles et scientifiques du fait de leur stabilité, de leur compacité et des …