Overview of recent progress in condition monitoring for insulated gate bipolar transistor modules: Detection, estimation, and prediction

M Huang, H Wang, L Bai, K Li, J Bai, X Zha - High Voltage, 2021 - Wiley Online Library
The insulated gate bipolar transistor (IGBT) is one of the most fragile components in power
electronics converters. In order to improve the reliability of IGBTs, various measurements are …

A simplified on-state voltage measurement circuit for power semiconductor devices

Y Peng, H Wang - IEEE Transactions on Power Electronics, 2021 - ieeexplore.ieee.org
This letter proposes a simplified converter-level on-state voltage measurement circuit for
power semiconductor devices, without an external power supply and self-power circuit. It …

A novel converter-level IGBT junction temperature estimation method based on the bus voltage ringing

Y Yang, P Zhang - IEEE Transactions on Power Electronics, 2021 - ieeexplore.ieee.org
Insulated gate bipolar transistor (IGBT) junction temperature monitoring is crucial for
converter's healthy management and condition monitoring. However, most conventional …

In situ diagnosis of multichip IGBT module wire bonding faults based on collector voltage undershoot

W Zhang, K Tan, B Ji, L Qi, X Cui… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Condition monitoring of insulated gate bipolar transistor (IGBT) modules is an effective way
to improve the transient performance and reliability of modular multilevel converters (MMC) …

An on-line calibration method for TSEP-based junction temperature estimation

Y Peng, Q Wang, H Wang… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Temperature sensitive electrical parameters (TSEP) provide an indirect and noninvasive
method for on-line junction temperature estimation of power semiconductor devices. It is …

A fast on-state voltage measurement circuit for power devices characterization

L Rossetto, G Spiazzi - IEEE Transactions on Power Electronics, 2021 - ieeexplore.ieee.org
The precise measurement of the on-state voltage of power devices working in real operating
conditions is the key for their characterization as well as health monitoring. This letter …

A method for separation of power semiconductor packaging-related wear-out mechanisms under converter operation

Y Peng, H Wang, H Wang - IEEE Transactions on Industrial …, 2023 - ieeexplore.ieee.org
This article proposes a new method to separate the package-related wear-out failure
mechanisms of wire-bonded silicon-based power semiconductor switches: bond-wires lift-off …

Floating-reference on-state voltage measurement strategy for condition monitoring application

M Ghadrdan, S Peyghami, H Mokhtari… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Due to its acceptable sensitivity to aging, on-state voltage is one of the best degradation
indicators ever devised to monitor the condition of power semiconductors. The steep …

A Self-Power Method for a Converter-Level on-State Voltage Measurement Concept

Y Peng, H Wang - IEEE Transactions on Power Electronics, 2021 - ieeexplore.ieee.org
This article discloses part of an invention on plug-and-play converter-level on-state voltage
measurement methods for power semiconductor devices. To exclude the external power …

In Situ Diagnosis of Wire Bonding Faults for Multichip IGBT Modules Based on the Crosstalk Effect

W Zhang, K Tan, B Ji, L Qi, X Cui… - IEEE Journal of …, 2021 - ieeexplore.ieee.org
Introducing bond wire diagnosis for multichip insulated gate bipolar transistor (IGBT)
modules is key to the health monitoring of modular multilevel converters (MMCs), which …