X Liu, X Li, H Su, Y Zhao, SS Ge - ISA transactions, 2023 - Elsevier
Emission source microscopy (ESM) technique can be utilized for localization of electromagnetic interference sources in the electronic systems, but its accuracy is limited by …
This work proposes a deep graph learning framework to identify, locate, and classify power, cyber, and cyber power events at the distribution system level. The proposed algorithm …
Advanced persistent threats and cyberattacks can impact wide-area monitoring, protection, and control (WAMPAC) system operation. Many cyber-physical system (CPS) testbeds have …
In the last years, the industrial automation has experienced a deep transformation known as Industry4. 0, and it is driven by Internet of Things (IoT) paradigm. The IoT-based automation …
X Liu, X Li, H Su, Y Zhao, SS Ge - researchgate.net
abstract Emission source microscopy (ESM) technique can be utilized for localization of electromagnetic interference sources in the electronic systems, but its accuracy is limited by …