Since it was first demonstrated in 1987, magnetic force microscopy (MFM) has become a
truly widespread and commonly used characterization technique that has been applied to a …

Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or
AC mode, is a proven, reliable, and gentle imaging mode with widespread applications …

Bimodal atomic force microscopy uses a cantilever that is simultaneously driven at two of its
eigenmodes (resonant modes). Parameters associated with both resonances can be …

We present the results of simultaneous scanning-tunneling and frequency-modulated
dynamic atomic force microscopy measurements with a qPlus setup. The qPlus sensor is a …

The ability to measure microsecond-and nanosecond-scale local dynamics below the
diffraction limit with widely available atomic force microscopy hardware would enable new …

It is well known that the low-Q regime in dynamic atomic force microscopy is afflicted by
instrumental artifacts (known as “the forest of peaks”) caused by piezoacoustic excitation of …

We present a detailed analysis and understanding of Kelvin probe force microscopy (KPFM)
data for a system of point charges in a vacuum-dielectric tip-sample system. Explicit …

Electric charge detection by atomic force microscopy (AFM) with single-electron resolution (e-
EFM) is a promising way to investigate the electronic level structure of individual quantum …

We present the first accurate damping profiles acquired in atomic-resolution hydration force
spectro<? format?> scopy, revealing a monotonic damping profile at the nanoscopic tip …

In this paper, we experimentally demonstrate two-state fluctuations in a metal-insulator-
semiconductor device formed out of a metallic atomic force microscopy tip, vacuum gap, and …