Electrical and optical characterizations of erbium doped MPS/PANI heterojunctions

RP Toledo, DR Huanca, AF Oliveira… - Applied Surface …, 2020 - Elsevier
Macroporous silicon (MPS) films were yielded by electrochemical anodization of p-type
crystalline silicon in HF: DMF. Following, a Schottky structure was obtained by depositing …

Negative differential resistance in Si nanostructure: role of interface traps

S Chakrabarty, SM Hossain - Physica Scripta, 2023 - iopscience.iop.org
Negative differential resistance (NDR) has been observed in IV characteristics measured
between two aluminum (Al) pads deposited on a layer containing Silicon nanostructures …

Origin of photo-enhanced hysteretic electrical conductance in nanostructured silicon-based heterojunction

S Chakrabarty, J Das, SM Hossain - Journal of Physics D …, 2022 - iopscience.iop.org
Photo-enhanced hysteretic I–V curves have been observed under reverse bias in a pin
structure containing electrochemically etched nanostructured silicon (Si) sandwiched …

[PDF][PDF] Investigation of carrier mobility degradation effects on MOSFET leakage simulations

HD Tsague, B Twala - International Journal of Computing, 2016 - academia.edu
The term carrier mobility generally alludes to both electron and hole mobility in
semiconductors. These parameters characterize how quickly an electron and/or hole moves …

Trap-assisted switching in silicon nanocrystal based pin device

S Chakrabarty, S Mandal, S Biswas… - … on Device and …, 2018 - ieeexplore.ieee.org
An all Si, pin device, consisting of a nanostructured porous Si layer sandwiched between a p-
type crystalline Si and an n-type amorphous Si, exhibits current controlled switching …

Study on amplitude of the noise power spectrum for nano-strained Si NMOSFET

M Hao, M Shao, Y Zhang, L Duan - Radiation Effects and Defects …, 2022 - Taylor & Francis
Based on the micro-transport mechanism of total dose to nano-strained Si MOS device, the
trapped charge is calculated. By solving the two-dimensional Poisson equation, the channel …

Photoluminescence of Hybrid Structure Base in ZnO@SiO2 Core-Shell Nanoparticles inside Porous Silicon

X León, E Osorio, R Pérez-Cuapio, C Bueno… - Solid State …, 2019 - Trans Tech Publ
In this work, core-shell ZnO@ SiO2 nanoparticles (NPs) were infiltrated into a macro/meso-
porous silicon (PS) structure, to study its luminescent properties. The core-shell ZnO@ SiO2 …

Effects of gamma-ray radiation on channel current of the uniaxial strained Si nano-scale NMOSFET

M Hao, H Hu, C Liao, B Wang - IEICE Electronics Express, 2017 - jstage.jst.go.jp
An analytical model of channel current for the uniaxial strained Si nanometer NMOSFET has
been developed with the degradation due to total dose irradiation taken into consideration …

Study on the Effect of Through Silicon Vias in Mitigating Single Event Transient Current

C Liao, J Yan, M Hao, W Zhao, X Ma… - … of Nanoelectronics and …, 2020 - ingentaconnect.com
Based on the coaxial TSV structure, this paper studies the uniaxial strained Si nanoscale n-
channel metaloxide-semiconductor field-effect transistor (NMOSFET) single-particle effect …

Study on the Charge Collection Mechanism of Single Event Transient Effect for Nano N-Channel Metal Oxide Semiconductor Field Effect Transistor

M Hao, C Liao, Q Zhang, Y Zhang… - Journal of …, 2020 - ingentaconnect.com
Based on the mechanism of charge collection, drift and diffusion, the influence of incident
position, drain bias and incident particle LET (Linear Energy Transfer) value on the charge …