Silicon wafers and transparent glass plates are major components in the semiconductor
industry. In semiconductor devices, the surface shape and optical thickness of the wafers …

Conventional imaging systems can only capture light intensity. Meanwhile, the lost phase
information may be critical for a variety of applications such as label-free microscopy and …

Transport of intensity equation (TIE) is a promising technique for quantitative phase imaging
(QPI). Usually, in TIE, two axially defocused intensity distributions are used to recover the …

The imaging quality of quantitative phase imaging (QPI) based on the transport of intensity
equation (TIE) can be improved using a higher-order approximation for defocused intensity …

Optical scanning holography (OSH) can be applied to 3D fluorescent imaging. However, the
optical setup for OSH is complicated due to the requirement of a phase shifter, a 2D …

Measuring objects with large reflectivity variations across their surface is one of the open
challenges in phase measurement profilometry (PMP). Saturated or dark pixels in the …

Holographic techniques are indispensable tools for modern optical engineering. Over the
past two decades, research about incoherent digital holography has continued to attract …

We propose a general method of designing phase-analysis algorithms for Ronchi phase-
shifting lateral-shearing interferometry. Based on the expression and method, three new …

This work has implemented a diverse modification of the Sagnac interferometer to
accommodate various measurement requirements, including phase shifting, pattern …

This paper describes a modified Sagnac interferometer with a self-referenced polarization
and phase-shifting technique for real-time thickness measurement of single-and double …