DS Jensen, SS Kanyal, N Madaan, MA Vail… - Surface Science …, 2013 - pubs.aip.org
Silicon (100) substrates are ubiquitous in microfabrication and, accordingly, their surface characteristics are important. Herein, we report the analysis of Si (100) via X-ray …
Peak fitting is an essential part of X-ray photoelectron spectroscopy (XPS) narrow scan analysis, and the Literature contains both good and bad examples of peak fitting. A common …
We demonstrate the development of a new atmospheric pressure-atomic layer deposition (AP-ALD) system to coat the inner walls of capillary columns for gas chromatography (GC) …
D Fichou, GE Morlock - Analytical chemistry, 2017 - ACS Publications
On the basis of open-source packages, 3D printing of thin silica gel layers is demonstrated as proof-of-principle for use in planar chromatography. A slurry doser was designed to …
GE Morlock - Journal of Chromatography A, 2015 - Elsevier
Office chromatography (OC) harnesses the novel combination of miniaturized planar separation science and modern print & media technologies. Interdisciplinary knowledge is …
DS Jensen, SS Kanyal, N Madaan… - Surface and …, 2013 - Wiley Online Library
We apply a suite of analytical tools to characterize materials created in the production of microfabricated thin layer chromatography plates. Techniques used include X‐ray …
We describe a method for plasma cleaning silicon surfaces in a commercial tool that removes adventitious organic contamination and enhances silane deposition. As shown by …
KL Stano, M Carroll, R Padbury… - … applied materials & …, 2014 - ACS Publications
Atomic layer deposition (ALD) can be used to coat high aspect ratio and high surface area substrates with conformal and precisely controlled thin films. Vertically aligned arrays of …
Molecular layer deposition (MLD) techniques were used to deposit conformal coatings on bulk quantities of carbon nanotubes (CNTs). Several metalcone MLD chemistries were …