A review of InP/InAlAs/InGaAs based transistors for high frequency applications

J Ajayan, D Nirmal - Superlattices and Microstructures, 2015 - Elsevier
This paper presents an overview of the rapid progress being made in the development of
InP based devices for high speed applications. Over the past few decades, major aero …

Nanometer-Scale III-V MOSFETs

JA Del Alamo, DA Antoniadis, J Lin… - IEEE Journal of the …, 2016 - ieeexplore.ieee.org
After 50 years of Moore's Law, Si CMOS, the mainstream logic technology, is on a course of
diminishing returns. The use of new semiconductor channel materials with improved …

Analysis of nanometer-scale InGaAs/InAs/InGaAs composite channel MOSFETs using high-K dielectrics for high speed applications

J Ajayan, D Nirmal, P Prajoon, JC Pravin - AEU-International Journal of …, 2017 - Elsevier
The outstanding electron transport properties of InGaAs and InAs semiconductor materials,
makes them attractive candidates for future nano-scale CMOS. In this paper, the ON state …

Monolithic III–V on silicon plasmonic nanolaser structure for optical interconnects

N Li, K Liu, VJ Sorger, DK Sadana - Scientific reports, 2015 - nature.com
Monolithic integration of III–V semiconductor lasers with Si circuits can reduce cost and
enhance performance for optical interconnects dramatically. We propose and investigate …

CMOS-Compatible Replacement Metal Gate InGaAs-OI FinFET With at V and nA/

V Djara, V Deshpande, M Sousa… - IEEE Electron …, 2016 - ieeexplore.ieee.org
We report CMOS-compatible n-channel InGaAson-insulator FinFETs obtained using a
replacement metal gate fabrication flow. The fabricated devices feature 12-nm-thick SiN x …

Iii-v mosfets for future cmos

JA Del Alamo, DA Antoniadis, J Lin… - 2015 IEEE …, 2015 - ieeexplore.ieee.org
In the last few years, as Si electronics faces mounting difficulties to maintain its historical
scaling path, transistors based on III-V compound semiconductors have emerged as a …

Capacitance modeling in III–V FinFETs

C Yadav, JP Duarte, S Khandelwal… - … on Electron Devices, 2015 - ieeexplore.ieee.org
We present a physics-based model of charge density and capacitance for III–V channel
double-gate nMOSFETs. The developed model accurately accounts for the impact of …

Compact model for low effective mass channel common double-gate MOSFET

AS Chakraborty, S Mahapatra - IEEE Transactions on Electron …, 2018 - ieeexplore.ieee.org
In the spirit of quantum drift-diffusion formalism, we propose a core compact model for low-
effective mass channel common double-gate MOSFET. In contrast to the existing models …

Modeling of charge and quantum capacitance in low effective mass III-V FinFETs

MD Ganeriwala, C Yadav… - IEEE Journal of the …, 2016 - ieeexplore.ieee.org
In this paper, we present a compact model for semiconductor charge and quantum
capacitance in III-V channel FETs. With III-V being viewed as the most promising candidate …

Field-Effect Mobility of InAs Surface Channel nMOSFET With Low Scaled Gate-Stack

SW Wang, T Vasen, G Doornbos… - … on Electron Devices, 2015 - ieeexplore.ieee.org
Frequency (100 Hz≤ f≤ 1 MHz) and temperature (-50≤ T 20° C) characteristics of low
interface state density D it high-κ gate-stacks on n-InAs have been investigated …