Nvmexplorer: A framework for cross-stack comparisons of embedded non-volatile memories

L Pentecost, A Hankin, M Donato, M Hempstead… - arXiv preprint arXiv …, 2021 - arxiv.org
Repeated off-chip memory accesses to DRAM drive up operating power for data-intensive
applications, and SRAM technology scaling and leakage power limits the efficiency of …

Reliable low voltage selector device technology based on robust SiNGeCTe arsenic-free chalcogenide

E Ambrosi, CH Wu, HY Lee, CM Lee… - IEEE Electron …, 2022 - ieeexplore.ieee.org
Modern data-centric computing applications are increasingly demanding in terms of memory
density and performance. The cross-point memory architecture based on the two-terminal …

Defect Engineering of BTe Ovonic Threshold Switch (OTS) with Nitrogen Doping for Improved Electrical and Reliability Performance

J Lee, S Ban, TH Lee, H Hwang - IEEE Electron Device Letters, 2023 - ieeexplore.ieee.org
This study investigates the effect of N-doping on the nanoscale (d= 30 nm) BTe ovonic
threshold switch (OTS) device to achieve ideal selector characteristics in terms of leakage …

Stateful logic using phase change memory

B Hoffer, N Wainstein, CM Neumann… - IEEE Journal on …, 2022 - ieeexplore.ieee.org
Stateful logic is a digital processing-in-memory (PIM) technique that could address von
Neumann memory bottleneck challenges while maintaining backward compatibility with …

Modeling and simulations of the integrated device of phase change memory and ovonic threshold switch selector with a confined structure

Z Chen, H Tong, W Cai, L Wang… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
We present a finite-element model for the confined-structure device integrating a phase
change memory (PCM) and an ovonic threshold switch (OTS) selector. In this model, the …

Multi level cell (MLC) in 3D crosspoint phase change memory array

N Gong - Science China Information Sciences, 2021 - pmc.ncbi.nlm.nih.gov
The success of memory technology is of vital importance in order to handle emerging mass
amount of data in our daily lives. Let us take one example here: The IBM summit is the …

Programming Operations Analysis and Statistics in One Selector and One Memory Ovonic Threshold Switching+ Phase‐Change Memory Double‐Patterned Self …

R Antonelli, G Bourgeois, S Martin… - physica status solidi …, 2024 - Wiley Online Library
This study explores the reliability of a phase‐change memory (PCM) cointegrated with an
ovonic threshold switching (OTS) selector (one selector and one memory 1S1R structure) …

One-Pulse-Programmable Multi-Level PCM/Selector Cross-Point Memory for 20 nm Half Pitch and Beyond

Y Matsuzawa, Y Ohnishi, K Katono… - … 2023-IEEE 53rd …, 2023 - ieeexplore.ieee.org
We demonstrated, for the first time, a multi-level phase change memory/selector cell which
can be operated without initialization or iterative verify, showing the potential for future cost …

Auto-Configuration Write Scheme With Enhanced Reliability for 3-D Cross-Point PCM

G Zhang, Y Lei, Z Song, Q Yu… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
3-D cross-point phase-change memory (PCM) is considered one of the most promising
candidates for storage-class memory. However, coupled IR drop and leakage currents …

Endurance evaluation on OTS-PCM device using constant current stress scheme

WC Chien, LM Gignac, YC Chou… - 2022 IEEE …, 2022 - ieeexplore.ieee.org
A constant current stress scheme is implemented for endurance study on OTS-PCM devices
for the first time. It provides a feasible method to estimate the read/write endurance for cross …