Today, the price of building a factory to produce submicron size electronic devices on 300
mm Si wafers is over billions of dollars. In processing a 300 mm Si wafer, over half of the …

In recent years, the mechanical behavior of low-dimensional materials has been attracting
lots of attention triggered both by the ongoing miniaturization and the extraordinary …

Scanning X-ray microdiffraction (µSXRD) combines the use of high-brilliance synchrotron
sources with the latest achromatic X-ray focusing optics and fast large-area two-dimensional …

The advent of nanosciences calls for the development of local structural probes, in particular
to characterize ill-ordered or heterogeneous materials. Furthermore, because materials …

Diffraction contrast tomography is a near-field diffraction-based imaging technique that
provides high-resolution grain maps of polycrystalline materials simultaneously with the …

My 12-year-old granddaughter Nina Alesi once asked me," Grandpa, you are a scientist at
IBM, so what do you do?" I tried to reply," Oh, I watch atoms move..." But before I could finish …

Abstract Knowledge about strain at the nanometre scale is essential for tailoring the
mechanical and electronic properties of materials. Flaws, cracks and their local strain fields …

The crystallographic texture of thin-film coatings plays an essential role in determining such
diverse materials properties as wear resistance, recording density in magnetic media and …

The prediction of damage and cracking patterns in ceramic thin films plays a vital role in the
optimal design thereof. In this study, we focus on developing a numerical framework to …

The three-dimensional characterization method described herein is based on diffraction and
scattering techniques combined with tomography and uses the variation of these signals to …