Pulse-induced low-power resistive switching in HfO2 metal-insulator-metal diodes for nonvolatile memory applications

C Walczyk, C Wenger, R Sohal, M Lukosius… - Journal of Applied …, 2009 - pubs.aip.org
The conduction process as well as the unipolar resistive switching behavior of Au∕ Hf O 2∕
Ti N metal-insulator-metal structures were investigated for future nonvolatile memory …

High- Metal–Insulator–Metal Capacitors for RF and Mixed-Signal VLSI Circuits: Challenges and Opportunities

D Kannadassan, K Sivasankaran… - Proceedings of the …, 2024 - ieeexplore.ieee.org
Metal–insulator–metal (MIM) capacitors are inevitable and critical passive components in
analog, mixed-signal, and memory applications. These capacitors occupy nearly 40% of …

Flexible inkjet printed high-k HfO 2-based MIM capacitors

G Vescio, J López-Vidrier, R Leghrib… - Journal of Materials …, 2016 - pubs.rsc.org
The soaring global demand for flexible, wearable and transparent devices has created an
urgent need for new fabrication technologies that are both cost-competitive and eco-friendly …

Structural and electrical properties of layered perovskite type Pr 2 Ti 2 O 7: experimental and theoretical investigations

SJ Patwe, V Katari, NP Salke, SK Deshpande… - Journal of materials …, 2015 - pubs.rsc.org
In this communication we report the details of the structural and thermal properties of
monoclinic layered perovskite type Pr2Ti2O7 (PTO) using ambient to higher temperature …

Dielectric Stacking Effect of and in Metal–Insulator–Metal Capacitor

IS Park, K Ryu, J Jeong, J Ahn - IEEE Electron Device Letters, 2012 - ieeexplore.ieee.org
The dielectric stacking effects of Al 2 O 3 and HfO 2 thin layers in metal-insulator-metal
capacitors are investigated for their leakage current, breakdown voltage, and voltage …

Field Effect and Strongly Localized Carriers in the Metal-Insulator Transition Material

K Martens, JW Jeong, N Aetukuri, C Rettner… - Physical Review Letters, 2015 - APS
The intrinsic field effect, the change in surface conductance with an applied transverse
electric field, of prototypal strongly correlated VO 2 has remained elusive. Here we report its …

Beyond the highs and lows: A perspective on the future of dielectrics research for nanoelectronic devices

M Jenkins, DZ Austin, JF Conley, J Fan… - ECS Journal of Solid …, 2019 - iopscience.iop.org
High-dielectric constant (high-k) gate oxides and low-dielectric constant (low-k) interlayer
dielectrics (ILD) have dominated the nanoelectronic materials research scene over the past …

Electronic structure of layered ferroelectric high-k titanate Pr2Ti2O7

VV Atuchin, TA Gavrilova, JC Grivel, VG Kesler… - Journal of Solid State …, 2012 - Elsevier
The spectroscopic parameters and electronic structure of binary titanate Pr2Ti2O7 have
been studied by IR-, Raman and X-ray photoelectron spectroscopy (XPS) for the powder …

Electrode oxygen-affinity influence on voltage nonlinearities in high-k metal-insulator-metal capacitors

C Vallée, P Gonon, C Jorel, F El Kamel - Applied Physics Letters, 2010 - pubs.aip.org
This work highlights the influence of the oxygen affinity of the metal electrodes used in high-
k metal-insulator-metal capacitors. Several metallic electrodes are tested in order to …

Nanomechanical properties of sputter-deposited HfO2 and HfxSi1-xO2 thin films

DK Venkatachalam, JE Bradby, MN Saleh… - Journal of Applied …, 2011 - pubs.aip.org
The mechanical properties of sputter-deposited HfO 2 and Hf x Si 1-x O 2 films were studied
as a function of composition using nanoindentation. The elastic modulus and hardness were …