Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts

N Kumar, A Rae, D Roy - Applied Physics Letters, 2014 - pubs.aip.org
Enhancement factor (EF) is an important measure of the quality of tip-enhanced Raman
spectroscopy (TERS) probes. Currently, due to the presence of far-field artefacts, EF is often …

Principle and application of tip-enhanced raman scattering

C Gao, W Lin, J Wang, R Wang, J Wang - Plasmonics, 2018 - Springer
Tip-enhanced Raman scattering (TERS), as a combination of scanning probe microscopy
(SPM) and surface-enhanced Raman spectroscopy (SERS) makes a huge progress in high …

STM-Tip-enhanced Raman spectroscopy toward single molecule scale

RB Jaculbia, K Miwa, N Hayazawa - Frontiers of Plasmon …, 2016 - ACS Publications
In this chapter, we describe the route of tip enhanced Raman spectroscopy towards the
single molecule scale. We pay particular attention to the use of the scanning tunneling …