Several hyperscalers have recently disclosed the occurrence of Silent Data Corruptions
(SDCs) in their systems fleets, sparking concerns about the severity of known and the …

Software-based self-test (SBST) has recently emerged as an effective methodology for the
manufacturing test of processors and other components in systems-on-chip (SoCs). By …

Deterministic functional test pattern generation has been a long-standing open problem,
which is an important problem to be solved for both design verification and manufacturing …

Software-based self-test (SBST) has recently emerged as an effective methodology for the
manufacturing test of processors and other components in Systems-on-Chip (SoCs). By …

Software-based self-test (SBST) is a promising approach for testing a processor core
embedded in a system-on-chip (SoC) system. Test routine development for SBST can be …

In this paper, we present a satisfiability (SAT)-based framework for automatically generating
test programs that target gate-level stuck-at faults in microprocessors. The microarchitectural …

Testing digital integrated circuits is generally done using Design-for-Testability (DfT)
solutions. Such solutions, however, introduce non-negligible area and timing overheads that …

Path Delay fault test currently exploits DfT-based techniques, mainly relying on scan chains,
widely supported by commercial tools. However, functional testing may be a desirable …

Online periodic self-testing is a cost-effective technique to ensure correct operation of
microprocessor-based systems in the field and improve their dependability in the presence …

New semiconductor technologies for advanced applications are more prone to defects and
imperfections related, among several different causes, to the manufacturing process, aging …