Recent Advances in controlled manipulation of micro/nano particles: A review
This review discusses the transformative impact of micro/nano particle manipulation
techniques across scientific and technological disciplines. Emphasizing the pivotal role of …
techniques across scientific and technological disciplines. Emphasizing the pivotal role of …
Diamagnetically levitated Milli-robots for heterogeneous 3D assembly
A Hsu, W Chu, C Cowan, B McCoy, A Wong-Foy… - Journal of Micro-Bio …, 2018 - Springer
In this article, we demonstrate diamagnetically levitated milli-robots performing 3D
heterogeneous micro-assembly of silicon micro-machined parts and polymer microspheres …
heterogeneous micro-assembly of silicon micro-machined parts and polymer microspheres …
Micro-object pose estimation with sim-to-real transfer learning using small dataset
Abstract Three-dimensional (3D) pose estimation of micro/nano-objects is essential for the
implementation of automatic manipulation in micro/nano-robotic systems. However, out-of …
implementation of automatic manipulation in micro/nano-robotic systems. However, out-of …
Automated robotic assembly for a micro-cartridge system inside the scanning electron microscope
M Bartenwerfer, C Diederichs… - 2014 IEEE International …, 2014 - ieeexplore.ieee.org
The AFM is a common tool for ultra-precise surface characterization and a standard
instrument a variety of research and development disciplines. However, the characterization …
instrument a variety of research and development disciplines. However, the characterization …
Path Following Control of an Atomic Force Microscope Driven by a Piezoelectric Inertia Actuated Robot Inside a Scanning Electron Microscope
Path following control of micrometer-sized tools is the key to improve automation capabilities
at the small scales. This paper addresses the issue of path following control for piezoelectric …
at the small scales. This paper addresses the issue of path following control for piezoelectric …
Model predictive control with obstacle avoidance for inertia actuated AFM probes inside a scanning electron microscope
S Liang, M Boudaoud, P Morin… - IEEE Robotics and …, 2020 - ieeexplore.ieee.org
The Atomic Force Microscope (AFM) is a reliable tool for 3D imaging and manipulation at the
micrometer and nanometer scales. When used inside a Scanning Electron Microscope …
micrometer and nanometer scales. When used inside a Scanning Electron Microscope …
Nanobits-exchangable and customisable scanning probe tips
I Yildiz - 2014 - orbit.dtu.dk
Invention of atomic force microscopy (AFM) pioneered a novel aspect for the surface
metrology concept. A range of scanning probe methods have been developed over the …
metrology concept. A range of scanning probe methods have been developed over the …