Precision positioning of an object relative to a reference point is a common task in many
activities of production engineering. Sensor technologies for single axis measurement …

Recording and (computational) processing of complex wave fields offer a vast realm of new
methods for optical 3D metrology. We discuss fundamental similarities and differences …

We present a frequency-sweeping heterodyne interferometer to measure an absolute
distance based on a frequency-tunable diode laser calibrated by an optical frequency comb …

Two algorithms of data processing are proposed to shorten the unmeasurable dead-zone
close to the zero-position of measurement, ie, the minimum working distance of a dispersive …

Structured light illumination is a well-established technology for noncontact 3D surface
measurements. A common challenge in those systems is to obtain the absolute surface …

Recent advances in multiwavelength interferometry techniques [Appl. Opt. 52, 5758 (2013)]
give new insights to phase unwrapping problems and allow the fringe order information …

This paper proposes a novel temporal phase unwrapping method which is a generalization
of the three commonly proposed approaches: hierarchical, heterodyne, and number …

The absolute optical thickness of a transparent plate 6-mm thick and 10 mm in diameter was
measured by the excess fraction method and a wavelength-tuning Fizeau interferometer …

Global illumination affects shape measurement accuracy, and phase unwrapping is an
important problem in phase measuring profilometry. In this paper, a micro-phase measuring …

During last two decades, CRT-based frequency estimation from undersampling waveforms
and its applications have been widely studied. It gives rise to the research of generalized …