Creation of silicon vacancy in silicon carbide by proton beam writing toward quantum sensing applications

T Ohshima, T Satoh, H Kraus… - Journal of Physics D …, 2018 - iopscience.iop.org
Single photon source (SPS) is a key element for quantum spintronics and quantum
photonics. It is known that several color centers such as silicon vacancy (V Si), divacancy (V …

SiC power MOSFETs performance, robustness and technology maturity

A Castellazzi, A Fayyaz, G Romano, L Yang… - Microelectronics …, 2016 - Elsevier
Abstract Relatively recently, SiC power MOSFETs have transitioned from being a research
exercise to becoming an industrial reality. The potential benefits that can be drawn from this …

Double negatively charged carbon vacancy at the h-and k-sites in 4H-SiC: Combined Laplace-DLTS and DFT study

I Capan, T Brodar, Ž Pastuović, R Siegele… - Journal of applied …, 2018 - pubs.aip.org
We present results from combined Laplace-Deep Level Transient Spectroscopy (Laplace-
DLTS) and density functional theory studies of the carbon vacancy (VC) in n-type 4H-SiC …

Experimental investigation on the machining characteristics of single-crystal SiC sawing with the fixed diamond wire

H Huang, Y Zhang, X Xu - The International Journal of Advanced …, 2015 - Springer
Machining characteristics and surface profiles were systematically investigated during the
fixed abrasive diamond wire sawing of single-crystal silicon carbide (SiC). The material …

Amplifier based on 4H-SiC MOSFET operation at 500° C for harsh environment applications

V Van Cuong, T Meguro, S Ishikawa… - … on Electron Devices, 2022 - ieeexplore.ieee.org
Successful operation of 4H-silicon carbide (SiC) MOSFET and integrated electronic circuit
based on 4H-SiC MOSFET is reported at temperature up to in air. The high-temperature …

EDM mechanism of single crystal SiC with respect to thermal, mechanical and chemical aspects

Y Zhao, M Kunieda, K Abe - Journal of Materials Processing Technology, 2016 - Elsevier
In this study, electrical discharge machining (EDM), a non-contact thermal machining
process, is proposed for machining single crystal silicon carbide (SiC) which exhibits …

Promise and challenges of high-voltage SiC bipolar power devices

T Kimoto, K Yamada, H Niwa, J Suda - Energies, 2016 - mdpi.com
Although various silicon carbide (SiC) power devices with very high blocking voltages over
10 kV have been demonstrated, basic issues associated with the device operation are still …

Divacancy and silicon vacancy color centers in 4H-SiC fabricated by hydrogen and dual ions implantation and annealing

T Sun, Z Xu, J Wu, Y Fan, F Ren, Y Song, L Yang… - Ceramics …, 2023 - Elsevier
Silicon carbide (SiC), as a wide-band gap semiconductor, plays an important role in high
temperature and high-power devices, and the spin defect has great application prospect in …

Ultra-precision dicing and wire sawing of silicon carbide (SiC)

S Cvetković, C Morsbach, L Rissing - Microelectronic Engineering, 2011 - Elsevier
This work presents results of mechanical machining investigations of two silicon carbide
(SiC) variants, monocrystalline SiC and polycrystalline (sintered) SiC ceramic. Two standard …

Quantitative analysis of nanoscale step dynamics in high-temperature solution-grown single crystal 4H-SiC via in situ confocal laser scanning microscope

A Onuma, S Maruyama, N Komatsu… - Crystal Growth & …, 2017 - ACS Publications
Nanoscale understanding of high-temperature crystal growth dynamics in solution has been
a challenge to be tackled by many researchers engaged in investigating solution processes …