GaN on Si technologies for power switching devices

M Ishida, T Ueda, T Tanaka… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
This paper reviews the recent activities for normally-off GaN-based gate injection transistors
(GITs) on Si substrates and their application to inverters. Epitaxial growth of the AlGaN/GaN …

Progress and prospects of group-III nitride semiconductors

SN Mohammad, H Morkoç - Progress in quantum electronics, 1996 - Elsevier
We review recent progress in the group-III nitride and related materials, and electronic and
optical devices based on them. Blue and UV (eg ultra violet) emitters and detectors, and …

X-ray diffraction of III-nitrides

MA Moram, ME Vickers - Reports on progress in physics, 2009 - iopscience.iop.org
The III-nitrides include the semiconductors AlN, GaN and InN, which have band gaps
spanning the entire UV and visible ranges. Thin films of III-nitrides are used to make UV …

Strain-related phenomena in GaN thin films

C Kisielowski, J Krüger, S Ruvimov, T Suski, JW Ager III… - Physical review B, 1996 - APS
Abstract Photoluminescence (PL), Raman spectroscopy, and x-ray diffraction are employed
to demonstrate the co-existence of a biaxial and a hydrostatic strain that can be present in …

Crystal growth and conductivity control of group III nitride semiconductors and their application to short wavelength light emitters

IAI Akasaki, HAH Amano - Japanese journal of applied physics, 1997 - iopscience.iop.org
Recent development of technology and understanding of the growth mechanism in
heteroepitaxial growth of nitrides on highly-mismatched substrates have enabled us to grow …

[图书][B] Introduction to nitride semiconductor blue lasers and light emitting diodes

S Nakamura, SF Chichibu - 2000 - taylorfrancis.com
The" blue laser" is an exciting new device used in physics. The potential is now being
recognized for its development into a commercial lighting system using about a tenth of the …

Lattice parameters of gallium nitride

M Leszczynski, H Teisseyre, T Suski, I Grzegory… - Applied Physics …, 1996 - pubs.aip.org
Lattice parameters of gallium nitride were measured using high-resolution x-ray diffraction.
The following samples were examined:(i) single crystals grown at pressure of about 15 …

Properties of strained wurtzite GaN and AlN: Ab initio studies

JM Wagner, F Bechstedt - Physical Review B, 2002 - APS
The structural, dielectric, lattice-dynamical, and electronic properties of biaxially and
uniaxially strained group-III nitrides are studied ab initio using a pseudopotential-plane …

Quantum confined Stark effect due to built-in internal polarization fields in (Al, Ga) N/GaN quantum wells

M Leroux, N Grandjean, M Laügt, J Massies, B Gil… - Physical Review B, 1998 - APS
Abstract (Al, Ga) N/GaN quantum wells have been studied by temperature-dependent
luminescence and reflectivity. The samples were grown by molecular beam epitaxy on …

Determination of the Al mole fraction and the band gap bowing of epitaxial films

H Angerer, D Brunner, F Freudenberg… - Applied Physics …, 1997 - pubs.aip.org
Al x Ga 1− x N alloys were grown on c-plane sapphire by plasma-induced molecular beam
epitaxy. The Al content x was varied over the whole composition range (0⩽ x⩽ 1). The molar …