NAND flash memory cell programming

S Aritome - US Patent 7,212,447, 2007 - Google Patents
(57) ABSTRACT A flash memory device, such as a NAND flash, having an array of floating
gate transistor memory cells arranged in a first and second addressable blocks. A voltage …

Nonvolatile semiconductor memory device capable of preventing write-disturb and method of programming

K Daichi, T Namekawa - US Patent 8,116,152, 2012 - Google Patents
According to an aspect of the invention is provided a non Volatile semiconductor memory
device, comprising a memory cell including an anti-fuse storage element and a selection …

One time programmable latch and method

B Taheri, S Maheshwari - US Patent 7,342,836, 2008 - Google Patents
US7342836B2 - One time programmable latch and method - Google Patents
US7342836B2 - One time programmable latch and method - Google Patents One time …

Anti-fuse latch circuit and method including self-test

G Stansell, F Jenne, I Kouznetzov, K Fox - US Patent 7,339,848, 2008 - Google Patents
A programmable latch circuit (100) can include a programmable data circuit (104) with a
data load path (116) that can enable a data value to be recalled into a volatile latch (102). A …

Circuit and method to increase read margin in non-volatile memories using a differential sensing circuit

H Vispute - US Patent 7,859,906, 2010 - Google Patents
Subtraction circuit. The circuit includes a second current-to 3,636,530 A 1/1972 Market al.
Voltage converter. The circuit also includes a second current 3,676,717 A 7, 1972 Lockwood …

Semiconductor integrated circuit with electrically programmable fuse

A Sueoka - US Patent 7,215,177, 2007 - Google Patents
(57) ABSTRACT A semiconductor integrated circuit comprises an electrically programmable
fuse element that is provided between a programming Voltage node and a latch node, and a …

Method and device for programming anti-fuses

GW Perkins - US Patent 7,486,535, 2009 - Google Patents
A device includes an anti-fuse including a first electrode that can be selectively coupled to a
first voltage reference and a second electrode that can be selectively coupled to a second …

Device and method for sensing programming status of non-volatile memory elements

GE Stansell, T Cewe - US Patent 7,426,142, 2008 - Google Patents
Non-volatile (NV) memories can be widely used in many electronics applications to store
data when power is not present. Examples of non-volatile memories include electri cally …

Anti-fuse latch self-test circuit and method

GE Stansell - US Patent 7,859,925, 2010 - Google Patents
CTRL rent source (216') can generate a current (IBASE) that can be mirrored in test sections
(252-0 and 252-1) and compared to a current drawn by either programmable element (210 …

Semiconductor device including fuse circuit

Y Sakamoto, K Yoshida - US Patent 9,431,128, 2016 - Google Patents
2. Description of Related Art In a semiconductor device, such as DRAM (Dynamic Random
Access Memory), a faulty memory cell is replaced with a redundant memory cell to redress …