Defect‐Enhanced Electron Transport through Semiconductor Barriers

L El Mir, JC Bourgoin - physica status solidi (b), 1998 - Wiley Online Library
It has often been suggested that defects can enhance electron tunneling through barriers.
Here, we derive a general expression of the current flowing through semiconductor barriers …

Irradiation effect on electron transport through GaAlAs barriers

H Chaabane, JC Bourgoin - Applied physics letters, 1994 - pubs.aip.org
The effect of electron irradiation on the electronic transport through GaAlAs barriers has
been studied. A drastic change in the current voltage characteristics has been observed. At …

Low threshold current density 1.3 µm InAs/InGaAs quantum dot lasers with InGaP cladding layers grown by gas-source molecular-beam epitaxy

FY Chang, JD Lee, HH Lin - Electronics Letters, 2004 - search.proquest.com
InAs/InGaAs quantum dot lasers with InGaP cladding layers grown by gas-source molecular-
beam epitaxy are reported. The laser emits 1.296 µm light output and demonstrates a very …

Role of defects on electron transport through semiconductor barriers

H Chaabane, JC Bourgoin - Journal of applied physics, 1994 - pubs.aip.org
We describe the effect of electron irradiation on the current‐voltage characteristics of
nonintentionally doped GaAlAs barriers imbedded in n‐type doped GaAs. It is found that …

Electron transport across bulk (Al/sub x/Ga/sub 1-x/)/sub 0.5/In/sub 0.5/P barriers determined from the IV characteristics of nin diodes measured between 60 and 310 K

AP Morrison, JD Lambkin… - IEEE journal of …, 2000 - ieeexplore.ieee.org
The electron transport characteristics of five nin diodes with (Al/sub x/Ga/sub 1-x/)/sub
0.5/In/sub 0.5/P intrinsic barrier regions of various aluminum composition x were determined …

Tunneling properties of As and AlAs barriers studied by ballistic electron luminescence spectroscopy

MV Petrov, SR Parihar, SA Lyon - Physical Review B, 1996 - APS
Tunneling through barriers of Al x Ga 1− x As and AlAs was studied using ballistic electron
luminescence spectroscopy. The luminescence provides information on the energy …

High voltage GaInP/GaAs dual-material Schottky rectifiers

KJ Schoen, ES Harmon, JM Woodall, TP Chin - Applied physics letters, 1997 - pubs.aip.org
A dual-material structure of lattice-matched GaInP on GaAs has a calculated figure of merit
which is approximately 60 times better than Si and 5 times better than GaAs. In this work, the …

Origins of reverse bias currents in a typical BPW34 photodiode

H Bayhan, Ş Özden - Turkish Journal of Physics, 2005 - journals.tubitak.gov.tr
Measurements of the dark reverse current in a typical BPW34 silicon photodiode have been
made in the temperature range 100-300 K at various reverse bias voltages ranging from 0 to …

Vertical transport in GaAs/Ga1− yAlyAs barrier structures containing quantum wells: Current–temperature characteristics

H Çelik, M Cankurtaran, S Altunöz - Superlattices and Microstructures, 2008 - Elsevier
Vertical transport in GaAs/Ga1− yAlyAs barrier structures was investigated using current–
temperature (I–T) measurements in the dark. The samples studied had 500 Å thick Ga1 …

[HTML][HTML] 金屬與磷化銦鎵蕭特基接觸之研究

DS Liu - 2003 - ir.lib.ncu.edu.tw
摘要(中) 本研究中, 分析金, 銅/金, 及鎳/金與磷化銦鎵接觸之蕭特基特性. 研究中發現剛蒸鍍好的
金, 銅/金, 及鎳/金與磷化銦鎵接觸之蕭特基位障分別為0.99, 0.99, 以及0.93 eV …