Nanomaterials by design: a review of nanoscale metallic multilayers

A Sáenz-Trevizo, AM Hodge - Nanotechnology, 2020 - iopscience.iop.org
Nanoscale metallic multilayers have been shown to have a wide range of outstanding
properties, which differ to a great extent from those observed in monolithic films. Their …

Beryllium-based multilayer X-ray optics

VN Polkovnikov, NN Salashchenko… - Physics …, 2020 - iopscience.iop.org
The article provides a review of the current state of affairs in the field of physics and
technology of multilayer beryllium-containing mirrors intended for projection lithography and …

Study of normal incidence of three-component multilayer mirrors in the range 20–40 nm

J Gautier, F Delmotte, M Roulliay, F Bridou, MF Ravet… - Applied …, 2005 - opg.optica.org
We study theoretically and experimentally the increase of normal incidence reflectivity
generated by addition of a third material in the period of a standard periodic multilayer, for …

Development of Al-based multilayer optics for EUV

E Meltchakov, C Hecquet, M Roulliay, S De Rossi… - Applied Physics A, 2010 - Springer
We report on the development of multilayer optics for the extreme ultra-violet (EUV) range.
The optical performance of Al-based multilayer mirrors is discussed with regard to promising …

Influence of Mo interlayers on the microstructure of layers and reflective characteristics of Ru/Be multilayer mirrors

RM Smertin, NI Chkhalo, MN Drozdov, SA Garakhin… - Optics …, 2022 - opg.optica.org
The influence of Mo interlayers on the microstructure of films and boundaries, and the
reflective characteristics of Ru/Be multilayer mirrors (MLM) were studied by X-ray …

Design, fabrication, and analysis of chirped multilayer mirrors for reflection of extreme-ultraviolet attosecond pulses

A Wonisch, U Neuhäusler, NM Kabachnik, T Uphues… - Applied …, 2006 - opg.optica.org
Chirped Mo/Si multilayer coatings have been designed, fabricated, and characterized for
use in extreme-ultraviolet attosecond experiments. By numerically simulating the reflection …

Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayers

M Trost, S Schröder, T Feigl, A Duparré… - Applied …, 2011 - opg.optica.org
Scattering resulting from interface imperfections critically affects the image contrast and
optical throughput of multilayer coatings for 13.5 nm. To investigate the scattering …

Spatial characterization of extreme ultraviolet plasmas generated by laser excitation of xenon gas targets

S Kranzusch, C Peth, K Mann - Review of scientific instruments, 2003 - pubs.aip.org
At Laser-Laboratorium Göttingen laser-plasma sources were tested, which are going to be
used for characterization of optical components and sensoric devices in the wavelength …

[HTML][HTML] Effect of rubidium incorporation on the optical properties and intermixing in Mo/Si multilayer mirrors for EUV lithography applications

M Saedi, C Sfiligoj, J Verhoeven, JWM Frenken - Applied Surface Science, 2020 - Elsevier
High reflectivity and long-term stability in multilayer mirrors (MLMs) are crucial for extreme
ultraviolet (EUV) photolithography. The conventional base stack to reflect 13.5 nm light is a …

Reflectance enhancement in the extreme ultraviolet and soft x rays by means of multilayers with more than two materials

JI Larruquert - JOSA A, 2002 - opg.optica.org
Sub-quarterwave multilayer coatings with more than two different materials are shown to
provide a reflectance enhancement compared with the standard two-material multilayer …