Delay monitoring system with multiple generic monitors for wide voltage range operation
As the semiconductor process technology continuously scales down, circuit delay variations
due to manufacturing and environmental variations become more and more serious. These …
due to manufacturing and environmental variations become more and more serious. These …
Critical Paths Prediction under Multiple Corners Based on BiLSTM Network
Q Song, X Cheng, P Cao - 2023 60th ACM/IEEE Design …, 2023 - ieeexplore.ieee.org
Critical path generation poses significant challenge to integrated circuit (IC) design flow in
terms of huge computational complexity and crucial impact to circuit optimization, whose …
terms of huge computational complexity and crucial impact to circuit optimization, whose …
Shavette: Low Power Neural Network Acceleration via Algorithm-level Error Detection and Undervolting
M Rinkinen, L Koskinen, O Silven… - arXiv preprint arXiv …, 2024 - arxiv.org
Reduced voltage operation is an effective technique for substantial energy efficiency
improvement in digital circuits. This brief introduces a simple approach for enabling reduced …
improvement in digital circuits. This brief introduces a simple approach for enabling reduced …
A novel machine-learning based SoC performance monitoring methodology under wide-range PVT variations with unknown critical paths
DH Wang, PJ Lin, HT Yang, CA Hsu… - 2021 58th ACM/IEEE …, 2021 - ieeexplore.ieee.org
Monitoring system-on-chip performance under process, voltage, and temperature (PVT)
variations is very challenging, especially when the parasitic effects dominate the whole chip …
variations is very challenging, especially when the parasitic effects dominate the whole chip …
[PDF][PDF] Shavette: Algorithm-Based Error Detection for Low Voltage Neural Network Acceleration
M Rinkinen, L Koskinen, O Silvén, M Safarpour - researchgate.net
This brief introduces an easy-to-integrate approach to enable significant power savings from
reduced voltage operation of Graphic Processing Units (GPUs) used for acceleration of …
reduced voltage operation of Graphic Processing Units (GPUs) used for acceleration of …
Integrated circuit workload, temperature, and/or sub-threshold leakage sensor
E Fayneh, I Weintrob, E Landman, Y David… - US Patent …, 2024 - Google Patents
An integrated circuit (IC) comprising: a margin measurement circuit configured to monitor
multiple data paths of the IC and to output, at different times, different ranges of remaining …
multiple data paths of the IC and to output, at different times, different ranges of remaining …
Die-to-die and chip-to-chip connectivity monitoring
E Fayneh, G Redler, E Landman - US Patent 12,013,800, 2024 - freepatentsonline.com
An input/output (I/O) sensor is provided for a multi-IC (Integrated Circuit) module. The I/O
sensor includes: a signal input, configured to receive a data signal from an interconnected …
sensor includes: a signal input, configured to receive a data signal from an interconnected …
Loopback testing of integrated circuits
E Fayneh, G Redler, S Cohen, E Landman - US Patent 12,123,908, 2024 - Google Patents
Loopback testing may be provided for one or more transmission output paths of a
semiconductor Integrated Circuit (IC). One or more parametric loopback sensors are …
semiconductor Integrated Circuit (IC). One or more parametric loopback sensors are …
Die-to-die connectivity monitoring
E Fayneh, G Redler, E Landman, IZ Cohen… - US Patent …, 2024 - Google Patents
An input/output (I/O) sensor for a multi-IC module. The I/O sensor includes: delay circuitry,
configured to receive a data signal from an interconnected part of an IC of the multi-IC …
configured to receive a data signal from an interconnected part of an IC of the multi-IC …