[HTML][HTML] Trends and challenges in design of embedded BCH error correction codes in multi-levels NAND flash memory devices

S Nabipour, J Javidan, R Drechsler - Memories-Materials, Devices, Circuits …, 2024 - Elsevier
Recently, there has been a growing concern regarding the dependability of NAND flash
cells, notably as the scale of their features reduces. To address this issue, implementing …